Samenvatting
We present a theoretical study of correlation effects of DX centers on electron mobility in Si δ-doped GaAs in the presence of an external hydrostatic pressure. A Monte Carlo approach has been developed to simulate these correlations through the charged-impurity distribution within the d+/DX0 and d+/DX- models. A detailed comparison between experiment and theory shows that theory excluding the correlation effects underestimates the electron mobility systematically, while the d+/DX- model can explain well the experimental data.
Originele taal-2 | Engels |
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Pagina's (van-tot) | 327-331 |
Aantal pagina's | 5 |
Tijdschrift | Brazilian Journal of Physics |
Volume | 27A |
Nummer van het tijdschrift | 4 |
Status | Gepubliceerd - 1 dec. 1997 |