Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

Patrick C. Deenen; Jeroen Middelhuis; Alp Akcay; Ivo J.B.F. Adan

doi:10.1007/s10696-023-09504-y

Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

Patrick C. Deenen (Corresponding author), Jeroen Middelhuis, Alp Akcay, Ivo J.B.F. Adan

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Correction to: Flexible Services and Manufacturing Journal https://doi.org/10.1007/s10696-023-09501-1 In this article, some minor design changes that have been made to Table 1. These changes aim to enhance the visibility and grouping of layer types within the table, thereby improving its overall clarity. The original article has been corrected. (Table presented.)

Originele taal-2	Engels
Pagina's (van-tot)	597-598
Aantal pagina's	2
Tijdschrift	Flexible Services and Manufacturing Journal
Volume	36
Nummer van het tijdschrift	2
DOI's	https://doi.org/10.1007/s10696-023-09504-y
Status	Gepubliceerd - jun. 2024

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Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
Deenen, P. C. (Corresponding author), Middelhuis, J., Akcay, A. & Adan, I. J. B. F., jun. 2024, In: Flexible Services and Manufacturing Journal. 36, 2, blz. 567-596 30 blz.
Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

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Deenen, P. C., Middelhuis, J., Akcay, A., & Adan, I. J. B. F. (2024). Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). Flexible Services and Manufacturing Journal, 36(2), 597-598. https://doi.org/10.1007/s10696-023-09504-y

Deenen, Patrick C. ; Middelhuis, Jeroen ; Akcay, Alp et al. / Correction to : Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). In: Flexible Services and Manufacturing Journal. 2024 ; Vol. 36, Nr. 2. blz. 597-598.

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abstract = "Correction to: Flexible Services and Manufacturing Journal https://doi.org/10.1007/s10696-023-09501-1 In this article, some minor design changes that have been made to Table 1. These changes aim to enhance the visibility and grouping of layer types within the table, thereby improving its overall clarity. The original article has been corrected. (Table presented.)",

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Deenen, PC, Middelhuis, J , Akcay, A & Adan, IJBF 2024, 'Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)', Flexible Services and Manufacturing Journal, vol. 36, nr. 2, blz. 597-598. https://doi.org/10.1007/s10696-023-09504-y

Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). / Deenen, Patrick C. (Corresponding author); Middelhuis, Jeroen ; Akcay, Alp et al.
In: Flexible Services and Manufacturing Journal, Vol. 36, Nr. 2, 06.2024, blz. 597-598.

Onderzoeksoutput: Bijdrage aan tijdschrift › Commentaar/Brief aan de redacteur › Academic › peer review

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Deenen PC, Middelhuis J , Akcay A , Adan IJBF. Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1). Flexible Services and Manufacturing Journal. 2024 jun.;36(2):597-598. doi: 10.1007/s10696-023-09504-y

Correction to: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions (Flexible Services and Manufacturing Journal, (2024), 36, 2, (567-596), 10.1007/s10696-023-09501-1)

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