Samenvatting
This paper presents a contactless measurement method for the characterization of highly integrated antennas. It is based on the backscattering method but omits the need to pre-determine the radar-cross-section of the antenna. The input reflection coefficient can even be obtained with an uncalibrated measurement system. Here, results for an X-band antenna are presented and compared with HFSS simulation results.
| Originele taal-2 | Engels |
|---|---|
| Titel | Proceedings of the 5th European Conference on Antennas and Propagation (EUCAP), 10-15 april 2011, Rome, Italy |
| Plaats van productie | London |
| Uitgeverij | Institution of Engineering and Technology |
| Pagina's | 797-801 |
| ISBN van geprinte versie | 978-1-4577-0250-1 |
| Status | Gepubliceerd - 2011 |
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