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Conformance analysis of ASML's test process

  • A. Rozinat
  • , I.S.M. Jong, de
  • , C.W. Günther
  • , W.M.P. Aalst, van der

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

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Samenvatting

Process mining allows for the automated discovery of process models from event logs. These models provide insights and enable various types of model-based analysis. However, in many situations already some normative process model is given, and the goal is not to discover a model, but to check its conformance. The process mining framework ProM provides a conformance checker able to investigate and quantify deviations between the real process (as recorded in the event log) and the modeled process. The conformance checker is one of the few tools available today that is able support regulatory compliance, i.e., ensuring that organizations and people take steps to comply with relevant laws, regulations, and procedures. In this paper, we report on a case study where the ProM framework has been applied to the test processes of ASML (the leading manufacturer of wafer scanners in the world). In this case study, we focus on the conformance aspect and compare the test process as it is really executed to the idealized reference model that ASML is using to instruct their test teams. This revealed that the real process is much more complicated than the idealized reference process. Moreover, we were able to suggest concrete improvement actions for the test process at ASML.
Originele taal-2Engels
TitelProceedings of the Second International Workshop on Governance, Risk and Compliance (GRCIS'09, Amsterdam, The Netherlands, June 8, 2009; co-located with CAISE '09)
RedacteurenS. Sadiq, M. Indulska, M. Muehlen, zur, E. Dubois, P. Johannesson
Plaats van productieAachen
UitgeverijCEUR-WS.org
Pagina's1-15
StatusGepubliceerd - 2009
Evenementconference; GRCIS '09; 2009-06-08; 2009-06-08 -
Duur: 8 jun. 20098 jun. 2009

Publicatie series

NaamCEUR Workshop Proceedings
Volume459
ISSN van geprinte versie1613-0073

Congres

Congresconference; GRCIS '09; 2009-06-08; 2009-06-08
Periode8/06/098/06/09
AnderGRCIS '09

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