Closed-loop Aspects in MIMO Fault Diagnosis with Application to Precision Mechatronics

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

4 Citaten (Scopus)

Samenvatting

Fault detection is essential in precision mechatronics to facilitate maintenance and minimize operational downtime. The aim of this paper is to develop a systematic procedure from identification to accurate nullspace-based fault diagnosis, accounting for the influence of noise and interaction in multivariable closed-loop control configurations. The influence of noise and interaction on the model estimate and fault diagnosis system are investigated through the use of closed-loop operators and by means of an illustrative case study.

Originele taal-2Engels
Titel2021 American Control Conference (ACC)
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's1756-1761
Aantal pagina's6
ISBN van elektronische versie9781665441971
DOI's
StatusGepubliceerd - 28 jul. 2021
Evenement2021 American Control Conference (ACC) - Virtual, Virtual, New Orleans, Verenigde Staten van Amerika
Duur: 25 mei 202128 mei 2021
http://acc2021.a2c2.org/

Congres

Congres2021 American Control Conference (ACC)
Verkorte titelACC 2021
Land/RegioVerenigde Staten van Amerika
StadVirtual, New Orleans
Periode25/05/2128/05/21
Internet adres

Bibliografische nota

Funding Information:
Koen Classens, Maurice Heemels and Tom Oomen are with the Faculty of Mechanical Engineering, Eindhoven University of Technology, The Netherlands This work is supported by Topconsortia voor Kennis en Innovatie (TKI), and is supported by ASML Research, Veldhoven, The Netherlands. E-mail corresponding author: [email protected]

Publisher Copyright:
© 2021 American Automatic Control Council.

Financiering

Koen Classens, Maurice Heemels and Tom Oomen are with the Faculty of Mechanical Engineering, Eindhoven University of Technology, The Netherlands This work is supported by Topconsortia voor Kennis en Innovatie (TKI), and is supported by ASML Research, Veldhoven, The Netherlands. E-mail corresponding author: [email protected]

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