Charge diffusion noise in monocrystalline PbS nanoparticle films

F. Otten, L.B. Kish, C.-G. Granqvist, L.K.J. Vandamme, R. Vajtai, F.E. Kruis, H. Fissan

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Samenvatting

Charge transport in monocrystalline lead sulfide (PbS) nanoparticle films is investigated by current noise measurements. Monocrystalline and single-sized PbS nanoparticles are synthesized via the gas phase and deposited electrostatically onto semiconducting (GaAs) and on isolating (SiNx) substrates with planar electrode contacts. The particles form inhomogeneous films. Low-frequency current noise of 1-ML-thick films are measured at various voltages, exhibiting diffusion noise characteristics, which indicates a random-walk (diffusion) phenomenon of electrons between the particles. ©2000 American Institute of Physics.
Originele taal-2Engels
Pagina's (van-tot)3421-3422
Aantal pagina's2
TijdschriftApplied Physics Letters
Volume77
Nummer van het tijdschrift21
DOI's
StatusGepubliceerd - 2000

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Otten, F., Kish, L. B., Granqvist, C-G., Vandamme, L. K. J., Vajtai, R., Kruis, F. E., & Fissan, H. (2000). Charge diffusion noise in monocrystalline PbS nanoparticle films. Applied Physics Letters, 77(21), 3421-3422. https://doi.org/10.1063/1.1327614