Characterization of an SRAM based particle detector for mixed-field radiation environments

Georgios Tsiligiannis; Luigi Dilillo; Alberto Bosio; Patrick Girard; Serge Pravossoudovitch; Aida Todri-Sanial; Arnaud Virazel; Julien Mekki; Markus Brugger; J.-R. Vaillé; Frederic Wrobel; Frédéric Saigné

doi:10.1109/IWASI.2013.6576070

Characterization of an SRAM based particle detector for mixed-field radiation environments

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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Monitoring mixed-field radiation environments is of great importance especially for facilities hosting large particle accelerators. Such facilities make use of monitors that are usually composed of different sensors, each one contributing to the evaluation of the radiation levels throughout the radiation harsh zones and also the effects over electronic devices. In this paper, we characterize our custom SRAM based monitors according to the results that we retrieved by irradiating our sensors at the H4IRRAD test facility of CERN. Based on the collected upsets of the SRAMs and also using the given particle fluence of the environment in which these devices were exposed to, we were able to check the effectiveness of the monitor with respect to the number of sensing devices (memories), the time and the particle fluence.

Originele taal-2	Engels
Titel	5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	75-80
Aantal pagina's	6
ISBN van elektronische versie	978-1-4799-0041-1
ISBN van geprinte versie	978-1-4799-0039-8
DOI's	https://doi.org/10.1109/IWASI.2013.6576070
Status	Gepubliceerd - 8 aug. 2013
Extern gepubliceerd	Ja
Evenement	5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2013) - Bari, Italië Duur: 13 jun. 2013 → 14 jun. 2013

Congres

Congres	5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2013)
Land/Regio	Italië
Stad	Bari
Periode	13/06/13 → 14/06/13

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10.1109/IWASI.2013.6576070

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Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri-Sanial, A., Virazel, A., Mekki, J., Brugger, M., Vaillé, J.-R., Wrobel, F., & Saigné, F. (2013). Characterization of an SRAM based particle detector for mixed-field radiation environments. In 5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI (blz. 75-80). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IWASI.2013.6576070

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title = "Characterization of an SRAM based particle detector for mixed-field radiation environments",

abstract = "Monitoring mixed-field radiation environments is of great importance especially for facilities hosting large particle accelerators. Such facilities make use of monitors that are usually composed of different sensors, each one contributing to the evaluation of the radiation levels throughout the radiation harsh zones and also the effects over electronic devices. In this paper, we characterize our custom SRAM based monitors according to the results that we retrieved by irradiating our sensors at the H4IRRAD test facility of CERN. Based on the collected upsets of the SRAMs and also using the given particle fluence of the environment in which these devices were exposed to, we were able to check the effectiveness of the monitor with respect to the number of sensing devices (memories), the time and the particle fluence.",

author = "Georgios Tsiligiannis and Luigi Dilillo and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Aida Todri-Sanial and Arnaud Virazel and Julien Mekki and Markus Brugger and J.-R. Vaill{\'e} and Frederic Wrobel and Fr{\'e}d{\'e}ric Saign{\'e}",

year = "2013",

month = aug,

day = "8",

doi = "10.1109/IWASI.2013.6576070",

language = "English",

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booktitle = "5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI",

publisher = "Institute of Electrical and Electronics Engineers",

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note = "5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2013) ; Conference date: 13-06-2013 Through 14-06-2013",

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Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Pravossoudovitch, S, Todri-Sanial, A, Virazel, A, Mekki, J, Brugger, M, Vaillé, J-R, Wrobel, F & Saigné, F 2013, Characterization of an SRAM based particle detector for mixed-field radiation environments. in 5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI. Institute of Electrical and Electronics Engineers, blz. 75-80, 5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2013), Bari, Italië, 13/06/13. https://doi.org/10.1109/IWASI.2013.6576070

Characterization of an SRAM based particle detector for mixed-field radiation environments. / Tsiligiannis, Georgios; Dilillo, Luigi; Bosio, Alberto et al.
5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI. Institute of Electrical and Electronics Engineers, 2013. blz. 75-80.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Characterization of an SRAM based particle detector for mixed-field radiation environments

AU - Tsiligiannis, Georgios

AU - Dilillo, Luigi

AU - Bosio, Alberto

AU - Girard, Patrick

AU - Pravossoudovitch, Serge

AU - Todri-Sanial, Aida

AU - Virazel, Arnaud

AU - Mekki, Julien

AU - Brugger, Markus

AU - Vaillé, J.-R.

AU - Wrobel, Frederic

AU - Saigné, Frédéric

PY - 2013/8/8

Y1 - 2013/8/8

N2 - Monitoring mixed-field radiation environments is of great importance especially for facilities hosting large particle accelerators. Such facilities make use of monitors that are usually composed of different sensors, each one contributing to the evaluation of the radiation levels throughout the radiation harsh zones and also the effects over electronic devices. In this paper, we characterize our custom SRAM based monitors according to the results that we retrieved by irradiating our sensors at the H4IRRAD test facility of CERN. Based on the collected upsets of the SRAMs and also using the given particle fluence of the environment in which these devices were exposed to, we were able to check the effectiveness of the monitor with respect to the number of sensing devices (memories), the time and the particle fluence.

AB - Monitoring mixed-field radiation environments is of great importance especially for facilities hosting large particle accelerators. Such facilities make use of monitors that are usually composed of different sensors, each one contributing to the evaluation of the radiation levels throughout the radiation harsh zones and also the effects over electronic devices. In this paper, we characterize our custom SRAM based monitors according to the results that we retrieved by irradiating our sensors at the H4IRRAD test facility of CERN. Based on the collected upsets of the SRAMs and also using the given particle fluence of the environment in which these devices were exposed to, we were able to check the effectiveness of the monitor with respect to the number of sensing devices (memories), the time and the particle fluence.

U2 - 10.1109/IWASI.2013.6576070

DO - 10.1109/IWASI.2013.6576070

M3 - Conference contribution

SN - 978-1-4799-0039-8

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BT - 5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI

PB - Institute of Electrical and Electronics Engineers

T2 - 5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2013)

Y2 - 13 June 2013 through 14 June 2013

ER -

Characterization of an SRAM based particle detector for mixed-field radiation environments

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