Chaos: The speed limiting phenomenon in dynamic atomic force microscopy

A. Keyvani, F. Alijani, H. Sadeghian, K. Maturova, H. Goosen, F. van Keulen

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Samenvatting

This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the controller of AFM is tuned to be faster than a certain threshold, the closed-loop system exhibits a chaotic behavior. The presence of chaos in the closed-loop dynamics is confirmed via bifurcation diagrams, Poincaré sections, and Lyapunov exponents. Unlike the previously detected chaos due to attractive forces in the AFM, which can be circumvented via simple changes in operation parameters, this newly identified chaos is seemingly inevitable and imposes an upper limit for the closed-loop bandwidth of the AFM.

Originele taal-2Engels
Artikelnummer224306
Aantal pagina's12
TijdschriftJournal of Applied Physics
Volume122
Nummer van het tijdschrift22
DOI's
StatusGepubliceerd - 14 dec 2017

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Keyvani, A., Alijani, F., Sadeghian, H., Maturova, K., Goosen, H., & van Keulen, F. (2017). Chaos: The speed limiting phenomenon in dynamic atomic force microscopy. Journal of Applied Physics, 122(22), [224306]. https://doi.org/10.1063/1.5000130