Carrier dynamics of LT InAs/GaAs QDs using time resolved differential reflectivity

D. Sreenivasan, J.E.M. Haverkort, H.H. Zhan, T. Eijkemans, R. Nötzel, J.H. Wolter

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

54 Downloads (Pure)

Samenvatting

We present a Time Resolved Differential Reflectivity (TRDR) study of LT (low temperature grown) Stransky - Krastanov InAs/GaAs Quantum Dots (QDs) grown using molecular beam epitaxy. The photoluminescence (PL) spectrum shows a QD-peak around 1200nm. In the TRDR measurements we observe an initial fast decay (80ps) followed by a much slower decay of about 800ps. The strong temperature dependence of the PL-signal is not observed in the reflectivity signal. This leads us to conclude that the electrons are trapped at a fast rate by As antisite defects while the hole decay dynamics take place at a slower rate, which is also monitored in TRDR.
Originele taal-2Engels
TitelProceedings of the 10th Annual Symposium IEEE/LEOS Benelux Chapter, 1-2 December 2005, Mons, Belgium
RedacteurenP. Mégret, M. Wuilpart, S. Bette, N. Staquet
Plaats van productieMons
UitgeverijIEEE/LEOS
StatusGepubliceerd - 2005
Evenement10th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 1-2, 2005, Mons, Belgium - Mons, België
Duur: 1 dec 20052 dec 2005

Congres

Congres10th Annual Symposium of the IEEE/LEOS Benelux Chapter, December 1-2, 2005, Mons, Belgium
LandBelgië
StadMons
Periode1/12/052/12/05
Ander10th Annual Symposium IEEE/LEOS Benelux Chapter, Mons, Belgium

Vingerafdruk Duik in de onderzoeksthema's van 'Carrier dynamics of LT InAs/GaAs QDs using time resolved differential reflectivity'. Samen vormen ze een unieke vingerafdruk.

  • Citeer dit

    Sreenivasan, D., Haverkort, J. E. M., Zhan, H. H., Eijkemans, T., Nötzel, R., & Wolter, J. H. (2005). Carrier dynamics of LT InAs/GaAs QDs using time resolved differential reflectivity. In P. Mégret, M. Wuilpart, S. Bette, & N. Staquet (editors), Proceedings of the 10th Annual Symposium IEEE/LEOS Benelux Chapter, 1-2 December 2005, Mons, Belgium Mons: IEEE/LEOS.