Samenvatting
Fault prediction models usually employ software metrics which were previously shown to be a strong predictor for defects, e.g., SLOC. However, metrics are usually defined on a microlevel (method, class, package), and should therefore be aggregated in order to provide insights in the evolution at the macro-level (system). In addition to traditional aggregation techniques such as the mean, median, or sum, recently econometric aggregation techniques, such as the Gini, Theil, and Hoover indices have been proposed. In this paper we wish to understand whether the aggregation technique influences the presence and strength of the relation between SLOC and defects. Our results indicate that correlation is not strong, and is influenced by the aggregation technique.
Originele taal-2 | Engels |
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Titel | Proceedings of the 2nd International Workshop on Emerging Trends in Software Metrics (WETSoM'11, Honolulu HI, USA, May 24, 2011) |
Plaats van productie | New York NY |
Uitgeverij | Association for Computing Machinery, Inc |
Pagina's | 23-26 |
ISBN van geprinte versie | 978-1-4503-0593-8 |
DOI's | |
Status | Gepubliceerd - 2011 |