Bit boundary testing coverage

N. Goga, F. Moldoveanu

    Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review


    In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard
    Originele taal-2Engels
    TitelProceedings of the 18th Canadian Conference on Electrical and Computer Engineering, CCECE 2005, Saskatoon, Saskatchewan, Canada, May 1-4, 2005
    UitgeverijInstitute of Electrical and Electronics Engineers
    ISBN van geprinte versie0-7803-8886-0
    StatusGepubliceerd - 2005


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