BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits

A. Zjajo; M.J. Barragan Asian; J. Pineda de Gyvez

doi:10.1109/DATE.2007.364477

BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits

A. Zjajo, M.J. Barragan Asian, J. Pineda de Gyvez

Electronic Systems

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

22 Citaten (Scopus)

134 Downloads (Pure)

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This paper reports a new built-in self-test scheme for analog and mixed-signal devices based on die-level process monitoring. The objective of this test is not to replace traditional specification-based tests, but to provide a reliable method for early identification of excessive process parameter variations in production tests that allows quickly discarding of the faulty circuits. Additionally, the possibility of on-chip process deviation monitoring provides valuable information, which is used to guide the test and to allow the estimation of selected performance figures. The information obtained through guiding and monitoring process variations is re-used and supplement the circuit calibration

Originele taal-2	Engels
Titel	Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France
Plaats van productie	New York
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	1-6
ISBN van geprinte versie	978-3-9810801-2-4
DOI's	https://doi.org/10.1109/DATE.2007.364477
Status	Gepubliceerd - 2007

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Zjajo, A., Barragan Asian, M. J., & Pineda de Gyvez, J. (2007). BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. In Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France (blz. 1-6). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DATE.2007.364477

Zjajo, A. ; Barragan Asian, M.J. ; Pineda de Gyvez, J. / BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France. New York : Institute of Electrical and Electronics Engineers, 2007. blz. 1-6

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title = "BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits",

abstract = "This paper reports a new built-in self-test scheme for analog and mixed-signal devices based on die-level process monitoring. The objective of this test is not to replace traditional specification-based tests, but to provide a reliable method for early identification of excessive process parameter variations in production tests that allows quickly discarding of the faulty circuits. Additionally, the possibility of on-chip process deviation monitoring provides valuable information, which is used to guide the test and to allow the estimation of selected performance figures. The information obtained through guiding and monitoring process variations is re-used and supplement the circuit calibration",

author = "A. Zjajo and {Barragan Asian}, M.J. and {Pineda de Gyvez}, J.",

year = "2007",

doi = "10.1109/DATE.2007.364477",

language = "English",

isbn = "978-3-9810801-2-4",

pages = "1--6",

booktitle = "Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France",

publisher = "Institute of Electrical and Electronics Engineers",

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Zjajo, A, Barragan Asian, MJ & Pineda de Gyvez, J 2007, BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. in Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France. Institute of Electrical and Electronics Engineers, New York, blz. 1-6. https://doi.org/10.1109/DATE.2007.364477

BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. / Zjajo, A.; Barragan Asian, M.J.; Pineda de Gyvez, J.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France. New York: Institute of Electrical and Electronics Engineers, 2007. blz. 1-6.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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N2 - This paper reports a new built-in self-test scheme for analog and mixed-signal devices based on die-level process monitoring. The objective of this test is not to replace traditional specification-based tests, but to provide a reliable method for early identification of excessive process parameter variations in production tests that allows quickly discarding of the faulty circuits. Additionally, the possibility of on-chip process deviation monitoring provides valuable information, which is used to guide the test and to allow the estimation of selected performance figures. The information obtained through guiding and monitoring process variations is re-used and supplement the circuit calibration

AB - This paper reports a new built-in self-test scheme for analog and mixed-signal devices based on die-level process monitoring. The objective of this test is not to replace traditional specification-based tests, but to provide a reliable method for early identification of excessive process parameter variations in production tests that allows quickly discarding of the faulty circuits. Additionally, the possibility of on-chip process deviation monitoring provides valuable information, which is used to guide the test and to allow the estimation of selected performance figures. The information obtained through guiding and monitoring process variations is re-used and supplement the circuit calibration

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DO - 10.1109/DATE.2007.364477

M3 - Conference contribution

SN - 978-3-9810801-2-4

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BT - Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France

PB - Institute of Electrical and Electronics Engineers

CY - New York

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Zjajo A, Barragan Asian MJ, Pineda de Gyvez J. BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. In Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2007, DATE '07, 16-20 April 2007, Nice Acropolis, France. New York: Institute of Electrical and Electronics Engineers. 2007. blz. 1-6 doi: 10.1109/DATE.2007.364477

BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits

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