Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

J.J.M. Kwaspen, H.C. Heyker

Onderzoeksoutput: Andere bijdrageOverige bijdrageAndere onderzoeksoutput

Originele taal-2Engels
UitgeverTechnische Universiteit Eindhoven
StatusGepubliceerd - 1998

Citeer dit

Kwaspen, J. J. M., & Heyker, H. C. (1998). Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs. Technische Universiteit Eindhoven.
Kwaspen, J.J.M. ; Heyker, H.C. / Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs. 1998. Technische Universiteit Eindhoven.
@misc{e6bf23429f544eeabb44631883932b13,
title = "Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs",
author = "J.J.M. Kwaspen and H.C. Heyker",
year = "1998",
language = "English",
publisher = "Technische Universiteit Eindhoven",
type = "Other",

}

Kwaspen, JJM & Heyker, HC 1998, Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs. Technische Universiteit Eindhoven.

Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs. / Kwaspen, J.J.M.; Heyker, H.C.

Technische Universiteit Eindhoven. 1998, .

Onderzoeksoutput: Andere bijdrageOverige bijdrageAndere onderzoeksoutput

TY - GEN

T1 - Behaviour comparison of bias-probes for on-wafer testing of MMICs and OEICs

AU - Kwaspen, J.J.M.

AU - Heyker, H.C.

PY - 1998

Y1 - 1998

M3 - Other contribution

PB - Technische Universiteit Eindhoven

ER -