Originele taal-2 | Engels |
---|---|
Titel | Proceedings of the 17th European Conference on Integrated Optics and Technical Exhibitionan, 19th Microoptics Conference(ECIO-MOC), 24-27 June 2014, Nice, France |
Pagina's | Tu 2b R2-1/2 |
Status | Gepubliceerd - 2014 |
AWG based wavelength-meter with pm resolution
D. D'Agostino, R.G. Broeke, M. Boerkamp, Jan Mink, H.P.M.M. Ambrosius, M.K. Smit
Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review
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