Automotive RF immunity test set-up analysis : why test results can't compare

Mart Coenen; H. Pues; T. Bousquet

Automotive RF immunity test set-up analysis : why test results can't compare

Mart Coenen
, H. Pues
, T. Bousquet

Integrated Circuits

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

1 Citaat (Scopus)

Samenvatting

Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.

Originele taal-2	Engels
Titel	Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia
Plaats van productie	Piscataway
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	71-75
ISBN van geprinte versie	978-1-4577-0862-6
Status	Gepubliceerd - 2011
Evenement	EMC Compo 2011. November 6-9, 2011, Dubrovnik, Croatia - Dubrovnik, Kroatië Duur: 6 nov. 2011 → 9 nov. 2011

Workshop

Workshop	EMC Compo 2011. November 6-9, 2011, Dubrovnik, Croatia
Verkorte titel	EMC Compo 2011
Land/Regio	Kroatië
Stad	Dubrovnik
Periode	6/11/11 → 9/11/11
Ander	EMCCompo2011

Citeer dit

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title = "Automotive RF immunity test set-up analysis : why test results can't compare",

abstract = "Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.",

author = "Mart Coenen and H. Pues and T. Bousquet",

year = "2011",

language = "English",

isbn = "978-1-4577-0862-6",

pages = "71--75",

booktitle = "Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia, EMC Compo 2011 ; Conference date: 06-11-2011 Through 09-11-2011",

}

Coenen, M, Pues, H & Bousquet, T 2011, Automotive RF immunity test set-up analysis : why test results can't compare. in Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia. Institute of Electrical and Electronics Engineers, Piscataway, blz. 71-75, EMC Compo 2011. November 6-9, 2011, Dubrovnik, Croatia, Dubrovnik, Kroatië, 6/11/11.

Automotive RF immunity test set-up analysis : why test results can't compare. / Coenen, Mart; Pues, H.; Bousquet, T.
Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia. Piscataway: Institute of Electrical and Electronics Engineers, 2011. blz. 71-75.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

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AU - Coenen, Mart

AU - Pues, H.

AU - Bousquet, T.

PY - 2011

Y1 - 2011

N2 - Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.

AB - Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level.

M3 - Conference contribution

SN - 978-1-4577-0862-6

SP - 71

EP - 75

BT - Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 8th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2011), November 6-9, 2011, Dubrovnik, Croatia

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ER -

Automotive RF immunity test set-up analysis : why test results can't compare

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