Automatic scan insertion and test generation for asynchronous circuits

F. Beest, te; A.M.G. Peeters; M. Verra; C.H. Berkel, van; H.G. Kerkhoff

doi:10.1109/TEST.2002.1041834

Automatic scan insertion and test generation for asynchronous circuits

F. Beest, te, A.M.G. Peeters, M. Verra, C.H. Berkel, van, H.G. Kerkhoff

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

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A test method for asynchronous handshake circuits is presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.

Originele taal-2	Engels
Titel	Proceedings IEEE International Test Conference 2002 (ITC 2002, Baltimore MD, USA, October 7-10, 2002)
Plaats van productie	Los Alamitos CA
Uitgeverij	IEEE Computer Society
Pagina's	804-813
DOI's	https://doi.org/10.1109/TEST.2002.1041834
Status	Gepubliceerd - 2002

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10.1109/TEST.2002.1041834

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@inproceedings{e5794e831c4a4700b8fc5cb1327adfc8,

title = "Automatic scan insertion and test generation for asynchronous circuits",

abstract = "A test method for asynchronous handshake circuits is presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.",

author = "{Beest, te}, F. and A.M.G. Peeters and M. Verra and {Berkel, van}, C.H. and H.G. Kerkhoff",

year = "2002",

doi = "10.1109/TEST.2002.1041834",

language = "English",

pages = "804--813",

booktitle = "Proceedings IEEE International Test Conference 2002 (ITC 2002, Baltimore MD, USA, October 7-10, 2002)",

publisher = "IEEE Computer Society",

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Automatic scan insertion and test generation for asynchronous circuits. / Beest, te, F.; Peeters, A.M.G.; Verra, M. et al.
Proceedings IEEE International Test Conference 2002 (ITC 2002, Baltimore MD, USA, October 7-10, 2002). Los Alamitos CA: IEEE Computer Society, 2002. blz. 804-813.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Automatic scan insertion and test generation for asynchronous circuits

AU - Beest, te, F.

AU - Peeters, A.M.G.

AU - Verra, M.

AU - Berkel, van, C.H.

AU - Kerkhoff, H.G.

PY - 2002

Y1 - 2002

N2 - A test method for asynchronous handshake circuits is presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.

AB - A test method for asynchronous handshake circuits is presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.

U2 - 10.1109/TEST.2002.1041834

DO - 10.1109/TEST.2002.1041834

M3 - Conference contribution

SP - 804

EP - 813

BT - Proceedings IEEE International Test Conference 2002 (ITC 2002, Baltimore MD, USA, October 7-10, 2002)

PB - IEEE Computer Society

CY - Los Alamitos CA

ER -

Automatic scan insertion and test generation for asynchronous circuits

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