Automatic generation of in-circuit tests for board assembly defects

Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

5 Citaten (Scopus)
205 Downloads (Pure)

Samenvatting

The components and the solder joints that are made during assembly to hold components to their printed circuit board can suffer from defects and therefore need to be tested. Many research papers on board-assembly testing focus on boundary scan test, processor-controlled test, or other powered digital testing techniques that mostly ignore the indispensable passive circuits and that can incur damage that could have been avoided by executing a non-powered test first. In-circuit testing is a non-powered test method that applies' stimuli and measures responses using probe needles. However, often used self-learning solutions for designing these tests need a known-good-board, entailing significant disadvantages. In this paper, a software tool is described that automatically generates in-circuit tests based on the product design files, without requiring probe access on every net. Furthermore, the tool indicates where on the board fault coverage is not maximal, and hence where extra probe access will improve the test quality.

Originele taal-2Engels
TitelProceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's13-18
Aantal pagina's6
ISBN van geprinte versie9781538651803
DOI's
StatusGepubliceerd - 15 aug. 2018
Evenement2nd IEEE International Test Conference in Asia, ITC-Asia 2018 - Harbin, China
Duur: 15 aug. 201817 aug. 2018

Congres

Congres2nd IEEE International Test Conference in Asia, ITC-Asia 2018
Land/RegioChina
StadHarbin
Periode15/08/1817/08/18

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