Automated system for noise-measurements on low-ohmic samples and magnetic sensors

R.J.W. Jonker, J. Briaire, L.K.J. Vandamme

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Samenvatting

An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments' LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis
Originele taal-2Engels
Pagina's (van-tot)730-735
Aantal pagina's6
TijdschriftIEEE Transactions on Instrumentation and Measurement
Volume48
Nummer van het tijdschrift3
DOI's
StatusGepubliceerd - 1999

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