Samenvatting
A review of recent developments in the field of passivation of c-Si surfaces is presented, with a particular focus on materials that can be prepared by atomic layer deposition (ALD). Besides Al2O3, various other novel passivation schemes have recently been developed, such as Ga2O3, Ta2O5, SiO2/Al2O3, HfO2/Al2O3 and TiO2, which altogether can passivate a wider variety of doped and textured Si surfaces. Moreover, they are interesting candidates in the emerging field of passivating contacts, for instance as novel tunnel oxides. In this field, ALD can offer some distinct advantages, such as a precise control in film thickness, composition and even area-selective deposition.
Originele taal-2 | Engels |
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Titel | 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 |
Uitgeverij | Institute of Electrical and Electronics Engineers |
Pagina's | 3655-3660 |
Aantal pagina's | 6 |
Volume | 2016-November |
ISBN van elektronische versie | 9781509027248 |
DOI's | |
Status | Gepubliceerd - 18 nov. 2016 |
Evenement | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Oregon Convention Center, Portland, Verenigde Staten van Amerika Duur: 5 jun. 2016 → 10 jun. 2016 Congresnummer: 43 https://www.ieee-pvsc.org/PVSC43/ |
Congres
Congres | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 |
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Verkorte titel | PVSC 2016 |
Land/Regio | Verenigde Staten van Amerika |
Stad | Portland |
Periode | 5/06/16 → 10/06/16 |
Internet adres |