Applications of cyclotron based ion scattering

L.J. IJzendoorn, van, J.W. Niemantsverdriet, R.J. Severens, P.W.L. Dijk, van, M.J.A. Voigt, de

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Samenvatting

Ion scattering expts. were performed with a 3-30 MeV AVF cyclotron. The wide range of available energies combined with proper beam handling allows many scattering techniques to be performed. At 1st an example of ordinary Rutherford backscattering spectrometry will be demonstrated on model catalysts as studied in surface chem. High energy backscattering spectrometry with 8.8 MeV He ions, which enhances the sensitivity for O, was applied to study the O removal from corroded archaeol. artifacts upon treatment with a H2 plasma. Elastic recoil detection anal. is shown feasible with He ions having incident energies between 10 and 15 MeV once combined with a thin film detector. The development of a setup for ion channeling expts. with the cyclotron is reported and 1st results promise to increase the angular resoln. in lattice deformation studies. [on SciFinder (R)]
Originele taal-2Engels
Pagina's (van-tot)114-121
TijdschriftNuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume89
Nummer van het tijdschrift1-4
DOI's
StatusGepubliceerd - 1994

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