Applications of cyclotron based ion scattering

L.J. IJzendoorn, van; J.W. Niemantsverdriet; R.J. Severens; P.W.L. Dijk, van; M.J.A. Voigt, de

doi:10.1016/0168-583X(94)95157-8

Applications of cyclotron based ion scattering

L.J. IJzendoorn, van, J.W. Niemantsverdriet, R.J. Severens, P.W.L. Dijk, van, M.J.A. Voigt, de

Plasma & Materials Processing

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

3 Citaten (Scopus)

152 Downloads (Pure)

Samenvatting

Ion scattering expts. were performed with a 3-30 MeV AVF cyclotron. The wide range of available energies combined with proper beam handling allows many scattering techniques to be performed. At 1st an example of ordinary Rutherford backscattering spectrometry will be demonstrated on model catalysts as studied in surface chem. High energy backscattering spectrometry with 8.8 MeV He ions, which enhances the sensitivity for O, was applied to study the O removal from corroded archaeol. artifacts upon treatment with a H2 plasma. Elastic recoil detection anal. is shown feasible with He ions having incident energies between 10 and 15 MeV once combined with a thin film detector. The development of a setup for ion channeling expts. with the cyclotron is reported and 1st results promise to increase the angular resoln. in lattice deformation studies. [on SciFinder (R)]

Originele taal-2	Engels
Pagina's (van-tot)	114-121
Tijdschrift	Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume	89
Nummer van het tijdschrift	1-4
DOI's	https://doi.org/10.1016/0168-583X(94)95157-8
Status	Gepubliceerd - 1994

Toegang tot document

10.1016/0168-583X(94)95157-8

621560Definitieve gepubliceerde versie, 828 KB

Citeer dit

@article{3b1de6537c454467a894cf30ce8e17e6,

title = "Applications of cyclotron based ion scattering",

abstract = "Ion scattering expts. were performed with a 3-30 MeV AVF cyclotron. The wide range of available energies combined with proper beam handling allows many scattering techniques to be performed. At 1st an example of ordinary Rutherford backscattering spectrometry will be demonstrated on model catalysts as studied in surface chem. High energy backscattering spectrometry with 8.8 MeV He ions, which enhances the sensitivity for O, was applied to study the O removal from corroded archaeol. artifacts upon treatment with a H2 plasma. Elastic recoil detection anal. is shown feasible with He ions having incident energies between 10 and 15 MeV once combined with a thin film detector. The development of a setup for ion channeling expts. with the cyclotron is reported and 1st results promise to increase the angular resoln. in lattice deformation studies. [on SciFinder (R)]",

author = "{IJzendoorn, van}, L.J. and J.W. Niemantsverdriet and R.J. Severens and {Dijk, van}, P.W.L. and {Voigt, de}, M.J.A.",

year = "1994",

doi = "10.1016/0168-583X(94)95157-8",

language = "English",

volume = "89",

pages = "114--121",

journal = "Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1-4",

}

TY - JOUR

T1 - Applications of cyclotron based ion scattering

AU - IJzendoorn, van, L.J.

AU - Niemantsverdriet, J.W.

AU - Severens, R.J.

AU - Dijk, van, P.W.L.

AU - Voigt, de, M.J.A.

PY - 1994

Y1 - 1994

N2 - Ion scattering expts. were performed with a 3-30 MeV AVF cyclotron. The wide range of available energies combined with proper beam handling allows many scattering techniques to be performed. At 1st an example of ordinary Rutherford backscattering spectrometry will be demonstrated on model catalysts as studied in surface chem. High energy backscattering spectrometry with 8.8 MeV He ions, which enhances the sensitivity for O, was applied to study the O removal from corroded archaeol. artifacts upon treatment with a H2 plasma. Elastic recoil detection anal. is shown feasible with He ions having incident energies between 10 and 15 MeV once combined with a thin film detector. The development of a setup for ion channeling expts. with the cyclotron is reported and 1st results promise to increase the angular resoln. in lattice deformation studies. [on SciFinder (R)]

AB - Ion scattering expts. were performed with a 3-30 MeV AVF cyclotron. The wide range of available energies combined with proper beam handling allows many scattering techniques to be performed. At 1st an example of ordinary Rutherford backscattering spectrometry will be demonstrated on model catalysts as studied in surface chem. High energy backscattering spectrometry with 8.8 MeV He ions, which enhances the sensitivity for O, was applied to study the O removal from corroded archaeol. artifacts upon treatment with a H2 plasma. Elastic recoil detection anal. is shown feasible with He ions having incident energies between 10 and 15 MeV once combined with a thin film detector. The development of a setup for ion channeling expts. with the cyclotron is reported and 1st results promise to increase the angular resoln. in lattice deformation studies. [on SciFinder (R)]

U2 - 10.1016/0168-583X(94)95157-8

DO - 10.1016/0168-583X(94)95157-8

M3 - Article

SN - 0168-583X

VL - 89

SP - 114

EP - 121

JO - Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

IS - 1-4

ER -

Applications of cyclotron based ion scattering

Samenvatting

Toegang tot document

Vingerafdruk

Citeer dit