Analyzing fuzziness in product quality & reliability information-flow during time-driven product-development-processes

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

2 Citaten (Scopus)

2 Downloads (Pure)

Originele taal-2	Engels
Pagina's (van-tot)	496-502
Tijdschrift	Proceedings: Annual Reliability and Maintainability Symposium
DOI's	https://doi.org/10.1109/RAMS.2002.981693
Status	Gepubliceerd - 2002

Toegang tot document

@article{b46debb72f4d43d6affcb14ec66b8aa4,

title = "Analyzing fuzziness in product quality & reliability information-flow during time-driven product-development-processes",

author = "Y. Lu and A.C. Brombacher and {Ouden, den}, P.H. and P.M.W. K{\"o}rvers",

year = "2002",

doi = "10.1109/RAMS.2002.981693",

language = "English",

pages = "496--502",

journal = "Proceedings: Annual Reliability and Maintainability Symposium",

issn = "0149-144X",

publisher = "Institute of Electrical and Electronics Engineers",

}

TY - JOUR

T1 - Analyzing fuzziness in product quality & reliability information-flow during time-driven product-development-processes

AU - Lu, Y.

AU - Brombacher, A.C.

AU - Ouden, den, P.H.

AU - Körvers, P.M.W.

PY - 2002

Y1 - 2002

U2 - 10.1109/RAMS.2002.981693

DO - 10.1109/RAMS.2002.981693

M3 - Article

SN - 0149-144X

SP - 496

EP - 502

JO - Proceedings: Annual Reliability and Maintainability Symposium

JF - Proceedings: Annual Reliability and Maintainability Symposium

ER -