Analysis of the reflection characteristics of a planar EBG structure on lossy silicon substrates

Q. Liu, Y. Xi, A. Reniers, A.B. Smolders

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

2 Citaten (Scopus)
160 Downloads (Pure)

Samenvatting

Electromagnetic band gap (EBG) structures can exhibit high impedance surface (HIS) performance on a lossless substrate. However, the performance of an EBG structure is not only determined by the type of element or physical dimensions, but also by the electrical characteristics of the dielectric substrate. The evolution of an EBG structure from HIS to metamaterial absorber with different lossy silicon substrates is analyzed and presented in a reflection magnitude and phase graph. The conductivity of the used substrate is introduced to represent the loss tangent of the silicon substrate. An equivalent circuit model is developed that models the EBG on a lossy silicon substrate. The small differences between calculated and simulated results are explained by ignoring the patch series inductance Ls and the capacitance Ch between the patch and ground plane. Based on the analysis of the reflection characteristics on lossy silicon substrates, this planar EBG structure provides an acceptable performance in BiCMOS technologies, but cannot be used in low-Ohmic CMOS technologies.
Originele taal-2Engels
Titel10th European Conference on Antennas and Propagation (EuCAP), 10-15 April 2016, Davos, Switzerland
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Aantal pagina's4
ISBN van geprinte versie978-88-907018-6-3
DOI's
StatusGepubliceerd - 2 jun 2016
Evenement10th European Conference on Antennas and Propagation (EuCAP 2016) - Davos, Zwitserland
Duur: 10 apr 201615 apr 2016
Congresnummer: 10
http://www.eucap.org/

Congres

Congres10th European Conference on Antennas and Propagation (EuCAP 2016)
Verkorte titelEuCAP 2016
Land/RegioZwitserland
StadDavos
Periode10/04/1615/04/16
Internet adres

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