Analysing highly uncertain user-product interaction in product development

Y. Lu; P.H. Ouden, den; A.C. Brombacher; W.H.J.M. Geudens; H, Harmann

Analysing highly uncertain user-product interaction in product development

Y. Lu
, P.H. Ouden, den
, A.C. Brombacher
, W.H.J.M. Geudens
, H, Harmann

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Originele taal-2	Engels
Titel	Proceedings of the 4th International Conference on Quality and Reliability (ICQR2005)
Plaats van productie	Beijing, China
Pagina's	289-297
Status	Gepubliceerd - 2005
Evenement	conference; The 4th International Conference on Quality and Reliability (ICQR2005); 2005-08-09; 2005-08-11 - Duur: 9 aug. 2005 → 11 aug. 2005

Congres

Congres	conference; The 4th International Conference on Quality and Reliability (ICQR2005); 2005-08-09; 2005-08-11
Periode	9/08/05 → 11/08/05
Ander	The 4th International Conference on Quality and Reliability (ICQR2005)

Citeer dit

@inproceedings{a424b1d1b80d43cf9747954ec3c35d92,

title = "Analysing highly uncertain user-product interaction in product development",

author = "Y. Lu and \{Ouden, den\}, P.H. and A.C. Brombacher and W.H.J.M. Geudens and H, Harmann",

year = "2005",

language = "English",

pages = "289--297",

booktitle = "Proceedings of the 4th International Conference on Quality and Reliability (ICQR2005)",

note = "conference; The 4th International Conference on Quality and Reliability (ICQR2005); 2005-08-09; 2005-08-11 ; Conference date: 09-08-2005 Through 11-08-2005",

}

Lu, Y , Ouden, den, PH , Brombacher, AC, Geudens, WHJM & Harmann, H 2005, Analysing highly uncertain user-product interaction in product development. in Proceedings of the 4th International Conference on Quality and Reliability (ICQR2005). Beijing, China, blz. 289-297, conference; The 4th International Conference on Quality and Reliability (ICQR2005); 2005-08-09; 2005-08-11, 9/08/05.

TY - GEN

T1 - Analysing highly uncertain user-product interaction in product development

AU - Lu, Y.

AU - Ouden, den, P.H.

AU - Brombacher, A.C.

AU - Geudens, W.H.J.M.

AU - Harmann, H,

PY - 2005

Y1 - 2005

M3 - Conference contribution

SP - 289

EP - 297

BT - Proceedings of the 4th International Conference on Quality and Reliability (ICQR2005)

CY - Beijing, China

T2 - conference; The 4th International Conference on Quality and Reliability (ICQR2005); 2005-08-09; 2005-08-11

Y2 - 9 August 2005 through 11 August 2005

ER -