Analog calibration of channel mismatches in time-interleaved ADCs

Pieter Harpe, Hans Hegt, Arthur Van Roermund

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

2 Citaten (Scopus)

Samenvatting

This paper presents a method for the on-chip measurement and correction of gain errors, offsets and time-skew errors in time-interleaved ADC's. With the proposed method, the errors can be measured and processed in the digital domain. Then, this information is used to optimize several digitally controlled analog parameters of the circuit, that minimize the effect of aforementioned mismatch errors. After optimization, the digital logic can be switched off completely in order to save power. Simulation results on a full-transistor implementation of the time-interleaved sampling structure show that the channel matching errors can be accurately compensated.

Originele taal-2Engels
TitelEuropean Conference on Circuit Theory and Design 2007, ECCTD 2007
Pagina's236-239
Aantal pagina's4
DOI's
StatusGepubliceerd - 2007
EvenementEuropean Conference on Circuit Theory and Design 2007, ECCTD 2007 - Seville, Spanje
Duur: 26 aug 200730 aug 2007

Congres

CongresEuropean Conference on Circuit Theory and Design 2007, ECCTD 2007
LandSpanje
StadSeville
Periode26/08/0730/08/07

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