Uittreksel
| Originele taal-2 | Engels |
|---|---|
| Titel | Proceedings of the European Conference on Lasers and Electro-Optics 2011 and the European Quantum Electronics Conference (CLEO Europe - EQEC 2011), 22-26 May 2011, Munich, Germany |
| Plaats van productie | Munich, Germany |
| Uitgeverij | Institute of Electrical and Electronics Engineers |
| Status | Gepubliceerd - 2011 |
| Evenement | 2011 European Conference on Lasers and Electro-Optics and the XIIIth European Quantum Electronics Conference (CLEO®/Europe-EQEC) 2011) - ICM Center of the New Munich Trade Fair Centre, Munich, Duitsland Duur: 22 mei 2011 → 26 mei 2011 http://2011.cleoeurope.org/ |
Congres
| Congres | 2011 European Conference on Lasers and Electro-Optics and the XIIIth European Quantum Electronics Conference (CLEO®/Europe-EQEC) 2011) |
|---|---|
| Verkorte titel | CLEO®/Europe-EQEC 2011 |
| Land | Duitsland |
| Stad | Munich |
| Periode | 22/05/11 → 26/05/11 |
| Ander | European Conference on Lasers and Electro-Optics 2011 and the European Quantum Electronics Conference (CLEO Europe - EQEC 2011) |
| Internet adres |
Vingerafdruk
Citeer dit
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An InAs/InP(100) QD Waveguide Photodetector for OCT application. / Jiao, Y.; Tilma, B.W.; Kotani, J.; Nötzel, R.; Smit, M.K.; Bente, E.A.J.M.
Proceedings of the European Conference on Lasers and Electro-Optics 2011 and the European Quantum Electronics Conference (CLEO Europe - EQEC 2011), 22-26 May 2011, Munich, Germany. Munich, Germany : Institute of Electrical and Electronics Engineers, 2011.Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review
TY - GEN
T1 - An InAs/InP(100) QD Waveguide Photodetector for OCT application
AU - Jiao, Y.
AU - Tilma, B.W.
AU - Kotani, J.
AU - Nötzel, R.
AU - Smit, M.K.
AU - Bente, E.A.J.M.
PY - 2011
Y1 - 2011
N2 - Abstract only.
AB - Abstract only.
M3 - Conference contribution
BT - Proceedings of the European Conference on Lasers and Electro-Optics 2011 and the European Quantum Electronics Conference (CLEO Europe - EQEC 2011), 22-26 May 2011, Munich, Germany
PB - Institute of Electrical and Electronics Engineers
CY - Munich, Germany
ER -