An approach to lifetime estimation of SiC MOSFETs subjected to thermal stress

Onderzoeksoutput: Bijdrage aan congresPoster

7 Downloads (Pure)
Originele taal-2Engels
StatusGepubliceerd - 2015

Bibliografische nota

International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM Europe 2015), 19-21 May 2015, Nuremberg

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