An Accurate Characterization Method for Integrated Polarization Converters

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Samenvatting

We present a characterization method for polarization converters which improves the accuracy of traditional characterization methods significantly. An experimental demonstration of the method is presented on the InP-membrane-on-silicon (IMOS) platform. The design and fabrication of the polarization converter is discussed, as well as the simulated polarization conversion efficiency. A device of only 4 microns is shown to achieve 97.5%±0.5% polarization conversion, corresponding to an extinction ratio of -16±0.9 dB. The traditional characterization method is compared to the new 4-port method, and the accuracy is improved from up to 20% to 0.5%.
Originele taal-2Engels
Artikelnummer 0600306
Aantal pagina's6
TijdschriftIEEE Journal of Quantum Electronics
Volume57
Nummer van het tijdschrift1
DOI's
StatusGepubliceerd - feb 2021

Vingerafdruk Duik in de onderzoeksthema's van 'An Accurate Characterization Method for Integrated Polarization Converters'. Samen vormen ze een unieke vingerafdruk.

Citeer dit