Alignment-based trace clustering

T. Chatain, J. Carmona, B.F. van Dongen

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

11 Citaten (Scopus)

Samenvatting

A novel method to cluster event log traces is presented in this paper. In contrast to the approaches in the literature, the clustering approach of this paper assumes an additional input: a process model that describes the current process. The core idea of the algorithm is to use model traces as centroids of the clusters detected, computed from a generalization of the notion of alignment. This way, model explanations of observed behavior are the driving force to compute the clusters, instead of current model agnostic approaches, e.g., which group log traces merely on their vector-space similarity. We believe alignment-based trace clustering provides results more useful for stakeholders. Moreover, in case of log incompleteness, noisy logs or concept drift, they can be more robust for dealing with highly deviating traces. The technique of this paper can be combined with any clustering technique to provide model explanations to the clusters computed. The proposed technique relies on encoding the individual alignment problems into the (pseudo-)Boolean domain, and has been implemented in our tool DarkSider that uses an open-source solver.

Originele taal-2Engels
TitelConceptual Modeling - 36th International Conference, ER 2017, Proceedings
RedacteurenH.C. Mayr, G. Guizzardi, H. Ma, O. Pastor
UitgeverijSpringer
Pagina's295-308
Aantal pagina's14
ISBN van geprinte versie9783319699035
DOI's
StatusGepubliceerd - 2017
Evenement36th International Conference on Conceptual Modeling, (ER2017) - Universitat Politecnica de Valencia, Valencia, Spanje
Duur: 6 nov 20179 nov 2017
Congresnummer: 36
http://er2017.pros.webs.upv.es/

Publicatie series

NaamLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume10650 LNCS
ISSN van geprinte versie0302-9743
ISSN van elektronische versie1611-3349
NaamInformation Systems and Applications, series LNISA
Volume10650

Congres

Congres36th International Conference on Conceptual Modeling, (ER2017)
Verkorte titelER 2017
LandSpanje
StadValencia
Periode6/11/179/11/17
Internet adres

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  • Citeer dit

    Chatain, T., Carmona, J., & van Dongen, B. F. (2017). Alignment-based trace clustering. In H. C. Mayr, G. Guizzardi, H. Ma, & O. Pastor (editors), Conceptual Modeling - 36th International Conference, ER 2017, Proceedings (blz. 295-308). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 10650 LNCS), (Information Systems and Applications, series LNISA; Vol. 10650). Springer. https://doi.org/10.1007/978-3-319-69904-2_24