Alignment-based Quality Metrics in Conformance Checking.

Boudewijn F. van Dongen; Josep Carmona; Thomas Chatain

Alignment-based Quality Metrics in Conformance Checking.

Boudewijn F. van Dongen, Josep Carmona, Thomas Chatain

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

Originele taal-2	Engels
Artikelnummer	2
Pagina's (van-tot)	77-80
Aantal pagina's	4
Tijdschrift	EMISA Forum
Volume	36
Nummer van het tijdschrift	2
Status	Gepubliceerd - 2016

Bibliografische nota

DBLP License: DBLP's bibliographic metadata records provided through http://dblp.org/ are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.

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https://dblp.org/db/journals/emisa/emisa36.html#DongenCC16

Citeer dit

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