Aliasing of Resonance Phenomena in Sampled-Data Feedback Control Design: Hazards, Modeling, and a Solution

T.A.E. Oomen, M.M.J. Wal, van de, O.H. Bosgra

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdrageAcademicpeer review

3 Citaten (Scopus)
83 Downloads (Pure)

Samenvatting

High-performance control design for electromechanical sampled-data systems with aliased plant dynamics is investigated. Though from a theoretical viewpoint the aliasing phenomenon is automatically handled by direct sampled-data control, such an approach cannot be used in conjunction with models derived through system identification. From a practical viewpoint, aliasing is often considered as an undesirable phenomenon and a typical remedy is the increase of the sampling frequency. However, the sampling frequency is upper bounded due to physical and economical constraints and aliasing may be inevitable. Control design for plants with aliased dynamics has not received explicit attention in the literature and it is not clear how to handle this situation. In this paper, it is shown that aliased resonance phenomena can effectively be suppressed in sampled-data feedback control design without the need for increasing the sampling frequency. Furthermore, it is shown experimentally on an industrial wafer stage that ignoring aliasing during control design can have a disastrous effect on closed-loop performance. Additionally, a novel, practically feasible procedure for identification of (possibly aliased) resonance phenomena based on multirate system theory is proposed.
Originele taal-2Engels
TitelProceedings of the 2007 American Control Conference (ACC 2007) 9-13 July 2007, New York, New York, USA
Plaats van productiePiscataway, New Jersey, USA
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's2881-2886
ISBN van geprinte versie1-4244-0988-8
DOI's
StatusGepubliceerd - 2007
Evenement2007 American Control Conference (ACC 2007), July 11-13, 2007, New York, NY, USA - Marriott Marquis Hotel at Times Square, New York, NY, Verenigde Staten van Amerika
Duur: 11 jul 200713 jul 2007
http://acc2007.a2c2.org/

Congres

Congres2007 American Control Conference (ACC 2007), July 11-13, 2007, New York, NY, USA
Verkorte titelACC 2007
LandVerenigde Staten van Amerika
StadNew York, NY
Periode11/07/0713/07/07
AnderIEEE American Control Conference
Internet adres

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  • Citeer dit

    Oomen, T. A. E., Wal, van de, M. M. J., & Bosgra, O. H. (2007). Aliasing of Resonance Phenomena in Sampled-Data Feedback Control Design: Hazards, Modeling, and a Solution. In Proceedings of the 2007 American Control Conference (ACC 2007) 9-13 July 2007, New York, New York, USA (blz. 2881-2886). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ACC.2007.4282145