Advanced transmission electron microscopy for functional polymer systems

J. Loos; E. Sourty; S.S. Bavel, van; K. Lu

doi:10.1017/S1431927608082081

Advanced transmission electron microscopy for functional polymer systems

J. Loos
, E. Sourty
, S.S. Bavel, van
, K. Lu

Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

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.

Originele taal-2	Engels
Pagina's (van-tot)	692-693
Aantal pagina's	2
Tijdschrift	Microscopy and Microanalysis
Volume	14
Nummer van het tijdschrift	2
DOI's	https://doi.org/10.1017/S1431927608082081
Status	Gepubliceerd - 2008

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10.1017/S1431927608082081

Center for Multiscale Electron Microscopy (CMEM)
Friedrich, H. (Manager), Bransen, M. (Education/onderzoek medewerker), Schmit, P. (Education/onderzoek medewerker), Schreur - Piet, I. (Inhoud) & Spoelstra, A. (Education/onderzoek medewerker)
Uitrusting/faciliteit: Onderzoekslaboratorium

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AU - Loos, J.

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AU - Bavel, van, S.S.

AU - Lu, K.

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JF - Microscopy and Microanalysis

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Advanced transmission electron microscopy for functional polymer systems

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Uitrusting

Center for Multiscale Electron Microscopy (CMEM)

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