Advanced motion control for next-generation precision mechatronics: Challenges for control, identification, and learning

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Manufacturing equipment and scientific instruments, including wafer scanners, printers, microscopes, and medical imaging scanners, require accurate and fast motions. Increasing requirements necessitate enhanced control performance. The aim of this paper is to identify several challenges for advanced motion control originating from these increasing accu- racy, speed, and cost requirements. For instance, flexible mechanics must be explicitly addressed through overactuation, oversensing, inferential control, and position-dependent control. This in turn requires suitable models of appropriate complexity, which are identified and learned from inexpensive experimental data. Several ongoing developments are outlined that constitute a part of an overall framework for control, identification, and learning of complex motion systems. In turn, this may pave the way for new mechatronic design principles, leading to fast lightweight machines where the spatio-temporal flexible mechanics are explicitly compensated through advanced motion control.
Originele taal-2Engels
TitelIEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON)
Pagina's1-12
Aantal pagina's12
StatusGepubliceerd - 7 mrt 2017
Evenement3rd IEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON 2017) - Nagaoka, Japan
Duur: 6 mrt 20177 mrt 2017
Congresnummer: 3
http://www2.iee.or.jp/~diic/samcon/2017/index.html?no-cache?171205

Congres

Congres3rd IEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON 2017)
Verkorte titelSAMCON2017
LandJapan
StadNagaoka
Periode6/03/177/03/17
Internet adres

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  • Citeer dit

    Oomen, T. (2017). Advanced motion control for next-generation precision mechatronics: Challenges for control, identification, and learning. In IEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON) (blz. 1-12)