Actuator and sensor selection for robust performance

M.M.J. Wal, van de; A.G. Jager, de

doi:10.1109/CDC.1997.649593

Actuator and sensor selection for robust performance

M.M.J. Wal, van de, A.G. Jager, de

Control Systems Technology

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

1 Citaat (Scopus)

49 Downloads (Pure)

Originele taal-2	Engels
Titel	Proceedings of the 36th IEEE conference on decision and control : December 10-12, 1997, San Diego, California, USA. Vol. 5
Plaats van productie	New York
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	4377-4378
ISBN van geprinte versie	0-7803-4190-2
DOI's	https://doi.org/10.1109/CDC.1997.649593
Status	Gepubliceerd - 1997

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10.1109/CDC.1997.649593

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Citeer dit

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title = "Actuator and sensor selection for robust performance",

author = "{Wal, van de}, M.M.J. and {Jager, de}, A.G.",

year = "1997",

doi = "10.1109/CDC.1997.649593",

language = "English",

isbn = "0-7803-4190-2",

pages = "4377--4378",

booktitle = "Proceedings of the 36th IEEE conference on decision and control : December 10-12, 1997, San Diego, California, USA. Vol. 5",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

Actuator and sensor selection for robust performance. / Wal, van de, M.M.J.; Jager, de, A.G.
Proceedings of the 36th IEEE conference on decision and control : December 10-12, 1997, San Diego, California, USA. Vol. 5. New York: Institute of Electrical and Electronics Engineers, 1997. blz. 4377-4378.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - Actuator and sensor selection for robust performance

AU - Wal, van de, M.M.J.

AU - Jager, de, A.G.

PY - 1997

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U2 - 10.1109/CDC.1997.649593

DO - 10.1109/CDC.1997.649593

M3 - Conference contribution

SN - 0-7803-4190-2

SP - 4377

EP - 4378

BT - Proceedings of the 36th IEEE conference on decision and control : December 10-12, 1997, San Diego, California, USA. Vol. 5

PB - Institute of Electrical and Electronics Engineers

CY - New York

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