Samenvatting
In this work we determine the factors that influence the accuracy of LEDs thermal transient analysis, in particular, the leakage of heat into the dome material and the parasitic generation of heat on the reflector cup surface due to the light reflection losses are considered. Our analysis indicates a significant impact of these two factors on interpretation of the thermal transient measurements of mid-power LEDs. The paper demonstrates the significance of the physical phenomena behind these factors for creation of LEDs finiteelement thermal models. We quantify the inaccuracies in the thermal structure functions associated with these effects. We determine possible inaccuracies of finite-element models parameters calibration by thermal structure function or transient thermal response alignment if these factors are not accounted for. We show a substantial impact of the parasitic heat losses on the LEDs' reflector cup surface on the results of thermal transient for LEDs with high internal quantum efficiency encapsulated in packages with low light extraction efficiency.
Originele taal-2 | Engels |
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Titel | 35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - Proceedings |
Uitgeverij | Institute of Electrical and Electronics Engineers |
Pagina's | 7-11 |
Aantal pagina's | 5 |
ISBN van elektronische versie | 9781735532509 |
Status | Gepubliceerd - mrt. 2019 |
Evenement | 35th Annual Thermal Measurement, Modeling and Management Symposium (SEMI-THERM 35) : Thermal Innovations that Make the World’s Technology Cool - Doubletree by Hilton, San Jose, Verenigde Staten van Amerika Duur: 18 mrt. 2019 → 22 mrt. 2019 |
Congres
Congres | 35th Annual Thermal Measurement, Modeling and Management Symposium (SEMI-THERM 35) |
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Land/Regio | Verenigde Staten van Amerika |
Stad | San Jose |
Periode | 18/03/19 → 22/03/19 |
Bibliografische nota
Publisher Copyright:© 2019 STEF.