A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis

O.O. Sy, M.C. Beurden, van, B.L. Michielsen, J.A.H.M. Vaessen, A.G. Tijhuis

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureHoofdstukAcademic

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Samenvatting

A statistical characterization of random electromagnetic interactions affected by resonances is presented. It hinges on the analysis of the variance and the kurtosis to assess the intensity of the resonances. The method is illustrated by the study of a randomly varying thin wire modeled by a Pocklington integral equation.
Originele taal-2Engels
TitelScientific computing in electrical engineering SCEE 2008
RedacteurenJ. Roos, L.R.J. Costa
Plaats van productieBerlin
UitgeverijSpringer
Pagina's117-124
Aantal pagina's8
ISBN van geprinte versie978-3-642-12293-4
DOI's
StatusGepubliceerd - 2008

Publicatie series

NaamMathematics in Industry
Volume14
ISSN van geprinte versie1612-3956

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  • Citeer dit

    Sy, O. O., Beurden, van, M. C., Michielsen, B. L., Vaessen, J. A. H. M., & Tijhuis, A. G. (2008). A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis. In J. Roos, & L. R. J. Costa (editors), Scientific computing in electrical engineering SCEE 2008 (blz. 117-124). (Mathematics in Industry; Vol. 14). Springer. https://doi.org/10.1007/978-3-642-12294-1_16