@inbook{2323f77f97044d5d9c78afe2808da2f2,
title = "A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis",
abstract = "A statistical characterization of random electromagnetic interactions affected by resonances is presented. It hinges on the analysis of the variance and the kurtosis to assess the intensity of the resonances. The method is illustrated by the study of a randomly varying thin wire modeled by a Pocklington integral equation.",
author = "O.O. Sy and {Beurden, van}, M.C. and B.L. Michielsen and J.A.H.M. Vaessen and A.G. Tijhuis",
year = "2008",
doi = "10.1007/978-3-642-12294-1_16",
language = "English",
isbn = "978-3-642-12293-4",
series = "Mathematics in Industry",
publisher = "Springer",
pages = "117--124",
editor = "J. Roos and L.R.J. Costa",
booktitle = "Scientific computing in electrical engineering SCEE 2008",
address = "Germany",
}