A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis

O.O. Sy; M.C. Beurden, van; B.L. Michielsen; J.A.H.M. Vaessen; A.G. Tijhuis

doi:10.1007/978-3-642-12294-1_16

A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis

O.O. Sy, M.C. Beurden, van, B.L. Michielsen, J.A.H.M. Vaessen, A.G. Tijhuis

Electromagnetics

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic

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Samenvatting

A statistical characterization of random electromagnetic interactions affected by resonances is presented. It hinges on the analysis of the variance and the kurtosis to assess the intensity of the resonances. The method is illustrated by the study of a randomly varying thin wire modeled by a Pocklington integral equation.

Originele taal-2	Engels
Titel	Scientific computing in electrical engineering SCEE 2008
Redacteuren	J. Roos, L.R.J. Costa
Plaats van productie	Berlin
Uitgeverij	Springer
Pagina's	117-124
Aantal pagina's	8
ISBN van geprinte versie	978-3-642-12293-4
DOI's	https://doi.org/10.1007/978-3-642-12294-1_16
Status	Gepubliceerd - 2008

Publicatie series

Naam	Mathematics in Industry
Volume	14
ISSN van geprinte versie	1612-3956

Toegang tot document

10.1007/978-3-642-12294-1_16

Metis244307Definitieve gepubliceerde versie, 2,46 MB

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Citeer dit

Sy, O. O., Beurden, van, M. C., Michielsen, B. L., Vaessen, J. A. H. M., & Tijhuis, A. G. (2008). A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis. In J. Roos, & L. R. J. Costa (editors), Scientific computing in electrical engineering SCEE 2008 (blz. 117-124). (Mathematics in Industry; Vol. 14). Springer. https://doi.org/10.1007/978-3-642-12294-1_16

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author = "O.O. Sy and {Beurden, van}, M.C. and B.L. Michielsen and J.A.H.M. Vaessen and A.G. Tijhuis",

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Sy, OO, Beurden, van, MC, Michielsen, BL, Vaessen, JAHM & Tijhuis, AG 2008, A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis. in J Roos & LRJ Costa (redactie), Scientific computing in electrical engineering SCEE 2008. Mathematics in Industry, vol. 14, Springer, Berlin, blz. 117-124. https://doi.org/10.1007/978-3-642-12294-1_16

A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis. / Sy, O.O.; Beurden, van, M.C.; Michielsen, B.L.; Vaessen, J.A.H.M.; Tijhuis, A.G.

Scientific computing in electrical engineering SCEE 2008. redactie / J. Roos; L.R.J. Costa. Berlin : Springer, 2008. blz. 117-124 (Mathematics in Industry; Vol. 14).

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic

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Sy OO, Beurden, van MC, Michielsen BL, Vaessen JAHM, Tijhuis AG. A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis. In Roos J, Costa LRJ, redacteurs, Scientific computing in electrical engineering SCEE 2008. Berlin: Springer. 2008. blz. 117-124. (Mathematics in Industry). https://doi.org/10.1007/978-3-642-12294-1_16