A set of benchmarks for modular testing of SOCs

E.J. Marinissen, V. Iyengar, K. Chakrabarty

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureHoofdstukAcademicpeer review

254 Citaten (Scopus)

Samenvatting

This paper presents the ITC'02 SOC test benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.
Originele taal-2Engels
TitelProceedings of the International Test Conference 2002
Plaats van productiePiscataway
UitgeverijInstitute of Electrical and Electronics Engineers
Pagina's519-528
ISBN van geprinte versie0-7803-7542-4
DOI's
StatusGepubliceerd - 2002
Extern gepubliceerdJa

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