A Self-calibrating current-steering 12-bit DAC based on new 1-bit self-test scheme

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Originele taal-2Engels
TitelProceedings of the IEEE IC Test Workshop 2004, 13-14 September 2004, Limerick, Ireland
Pagina's49-54
StatusGepubliceerd - 2004

Citeer dit

Radulov, G. I., Quinn, P. J., Hegt, J. A., & Roermund, van, A. (2004). A Self-calibrating current-steering 12-bit DAC based on new 1-bit self-test scheme. In Proceedings of the IEEE IC Test Workshop 2004, 13-14 September 2004, Limerick, Ireland (blz. 49-54)