A methodology to determine the sites of variability in an LED assembly

Robin Bornoff; Thomas Merelle; Josephine Sari; Alessandro Di Bucchianico; Gabor Farkas

A methodology to determine the sites of variability in an LED assembly

Robin Bornoff
, Thomas Merelle
, Josephine Sari
, Alessandro Di Bucchianico
, Gabor Farkas

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

Samenvatting

Variations in the manufacturing assembly process together with any changes in materials sourcing can give rise to variation in the functional performance of an LED. These variations can lead to differences in thermal characteristics such as Zth (transient thermal impedance) and RthJC (thermal resistance between chip junction and case. This study aims to analyze the measured variations of a number of LED samples and explore a methodology that will provide insights into the root cause of those variations, In addition the statistical properties of the variations are applied in a Monte Carlo thermal modelling context. Such insights and modelling methods would be employed by a lighting engineer when selecting LEDs and when simulating their thermal dependent optical behavior.

Originele taal-2	Engels
Titel	35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - Proceedings
Uitgeverij	Institute of Electrical and Electronics Engineers
Pagina's	61-65
Aantal pagina's	5
ISBN van elektronische versie	9781735532509
Status	Gepubliceerd - mrt. 2019
Evenement	35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - San Jose, Verenigde Staten van Amerika Duur: 18 mrt. 2019 → 22 mrt. 2019

Congres

Congres	35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019
Land/Regio	Verenigde Staten van Amerika
Stad	San Jose
Periode	18/03/19 → 22/03/19

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@inproceedings{576b79951f974adb93551a7047684cc8,

title = "A methodology to determine the sites of variability in an LED assembly",

abstract = "Variations in the manufacturing assembly process together with any changes in materials sourcing can give rise to variation in the functional performance of an LED. These variations can lead to differences in thermal characteristics such as Zth (transient thermal impedance) and RthJC (thermal resistance between chip junction and case. This study aims to analyze the measured variations of a number of LED samples and explore a methodology that will provide insights into the root cause of those variations, In addition the statistical properties of the variations are applied in a Monte Carlo thermal modelling context. Such insights and modelling methods would be employed by a lighting engineer when selecting LEDs and when simulating their thermal dependent optical behavior. ",

keywords = "LED, Structure Function, Variation",

author = "Robin Bornoff and Thomas Merelle and Josephine Sari and \{Di Bucchianico\}, Alessandro and Gabor Farkas",

year = "2019",

month = mar,

language = "English",

pages = "61--65",

booktitle = "35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 ; Conference date: 18-03-2019 Through 22-03-2019",

}

Bornoff, R, Merelle, T, Sari, J, Di Bucchianico, A & Farkas, G 2019, A methodology to determine the sites of variability in an LED assembly. in 35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - Proceedings., 9165274, Institute of Electrical and Electronics Engineers, blz. 61-65, 35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019, San Jose, Verenigde Staten van Amerika, 18/03/19.

A methodology to determine the sites of variability in an LED assembly. / Bornoff, Robin; Merelle, Thomas; Sari, Josephine et al.
35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - Proceedings. Institute of Electrical and Electronics Engineers, 2019. blz. 61-65 9165274.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - A methodology to determine the sites of variability in an LED assembly

AU - Bornoff, Robin

AU - Merelle, Thomas

AU - Sari, Josephine

AU - Di Bucchianico, Alessandro

AU - Farkas, Gabor

PY - 2019/3

Y1 - 2019/3

N2 - Variations in the manufacturing assembly process together with any changes in materials sourcing can give rise to variation in the functional performance of an LED. These variations can lead to differences in thermal characteristics such as Zth (transient thermal impedance) and RthJC (thermal resistance between chip junction and case. This study aims to analyze the measured variations of a number of LED samples and explore a methodology that will provide insights into the root cause of those variations, In addition the statistical properties of the variations are applied in a Monte Carlo thermal modelling context. Such insights and modelling methods would be employed by a lighting engineer when selecting LEDs and when simulating their thermal dependent optical behavior.

AB - Variations in the manufacturing assembly process together with any changes in materials sourcing can give rise to variation in the functional performance of an LED. These variations can lead to differences in thermal characteristics such as Zth (transient thermal impedance) and RthJC (thermal resistance between chip junction and case. This study aims to analyze the measured variations of a number of LED samples and explore a methodology that will provide insights into the root cause of those variations, In addition the statistical properties of the variations are applied in a Monte Carlo thermal modelling context. Such insights and modelling methods would be employed by a lighting engineer when selecting LEDs and when simulating their thermal dependent optical behavior.

KW - LED

KW - Structure Function

KW - Variation

UR - https://www.scopus.com/pages/publications/85068223970

M3 - Conference contribution

AN - SCOPUS:85068223970

SP - 61

EP - 65

BT - 35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019 - Proceedings

PB - Institute of Electrical and Electronics Engineers

T2 - 35th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2019

Y2 - 18 March 2019 through 22 March 2019

ER -

A methodology to determine the sites of variability in an LED assembly

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