A consistent full-field integrated DIC framework for HR-EBSD

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A general, transparent, finite-strain Integrated Digital Image Correlation (IDIC) framework for high angular resolution EBSD (HR-EBSD) is proposed, and implemented through a rigorous derivation of the optimization scheme starting from the fundamental brightness conservation equation in combination with a clear geometric model of the Electron BackScatter Pattern (EBSP) formation. This results in a direct one-step correlation of the full field-of-view of EBSPs, which is validated here on dynamically simulated patterns. Strain and rotation component errors are, on average, (well) below 10−5 for small (Eeq=0.05%) and medium (Eeq=0.2%) strain, and below 3×10−5 for large strain (Eeq=1%), all for large rotations up to 10° and 2% image noise. High robustness against poor initial guesses (1° misorientation and zero strain) and typical convergence in 5 iterations is consistently observed for, respectively, image noise up to 20% and 5%. This high accuracy and robustness rivals, when comparing validation on dynamically simulated patterns, the most accurate HR-EBSD algorithms currently available which combine sophisticated filtering and remapping strategies with an indirect two-step correlation approach of local subset ROIs. The proposed general IDIC/HR-EBSD framework lays the foundation for future extensions towards more accurate EBSP formation models or even absolute HR-EBSD.

Originele taal-2Engels
Pagina's (van-tot)44-50
Aantal pagina's7
TijdschriftUltramicroscopy
Volume191
DOI's
StatusGepubliceerd - 1 aug 2018

Vingerafdruk

Dacarbazine
angular resolution
high resolution
Electrons
conservation equations
misalignment
set theory
field of view
iteration
Luminance
Conservation
brightness
electrons
derivation
optimization

Citeer dit

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title = "A consistent full-field integrated DIC framework for HR-EBSD",
abstract = "A general, transparent, finite-strain Integrated Digital Image Correlation (IDIC) framework for high angular resolution EBSD (HR-EBSD) is proposed, and implemented through a rigorous derivation of the optimization scheme starting from the fundamental brightness conservation equation in combination with a clear geometric model of the Electron BackScatter Pattern (EBSP) formation. This results in a direct one-step correlation of the full field-of-view of EBSPs, which is validated here on dynamically simulated patterns. Strain and rotation component errors are, on average, (well) below 10−5 for small (Eeq=0.05{\%}) and medium (Eeq=0.2{\%}) strain, and below 3×10−5 for large strain (Eeq=1{\%}), all for large rotations up to 10° and 2{\%} image noise. High robustness against poor initial guesses (1° misorientation and zero strain) and typical convergence in 5 iterations is consistently observed for, respectively, image noise up to 20{\%} and 5{\%}. This high accuracy and robustness rivals, when comparing validation on dynamically simulated patterns, the most accurate HR-EBSD algorithms currently available which combine sophisticated filtering and remapping strategies with an indirect two-step correlation approach of local subset ROIs. The proposed general IDIC/HR-EBSD framework lays the foundation for future extensions towards more accurate EBSP formation models or even absolute HR-EBSD.",
keywords = "Electron backscatter diffraction, Finite-strain formulation, High angular resolution EBSD, High strain accuracy, HR-EBSD, Integrated DIC, Virtual experiments",
author = "T. Vermeij and J.P.M. Hoefnagels",
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A consistent full-field integrated DIC framework for HR-EBSD. / Vermeij, T.; Hoefnagels, J.P.M.

In: Ultramicroscopy, Vol. 191, 01.08.2018, blz. 44-50.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

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