A classification scheme for AM control strategies: the AM V-model

Thomas Hafkamp; Gregor van Baars; Bram de Jager; Pascal Etman

A classification scheme for AM control strategies: the AM V-model

Thomas Hafkamp, Gregor van Baars, Bram de Jager, Pascal Etman

Control Systems Technology

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

1 Citaat (Scopus)

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The current lack of consistent additive manufacturing (AM) part quality gives rise to the development of novel process monitoring and control strategies [1]. The identification of these strategies can be facilitated by formulating a classification scheme to position development efforts. This work proposes a classification scheme that was developed in the context of vat photopolymerization [2], but is expected to be applicable to a wide range of AM technologies since many commonalities exist in the multi-level control characteristics.

Originele taal-2	Engels
Titel	Proceedings - 2018 ASPE and euspen Summer Topical Meeting
Subtitel	Advancing Precision in Additive Manufacturing
Plaats van productie	Raleigh
Uitgeverij	American Society of Precision Engineering (ASPE)
Pagina's	161-166
Aantal pagina's	6
ISBN van elektronische versie	9781887706766
Status	Gepubliceerd - 1 jan. 2018
Evenement	2018 ASPE and EUSPEN Summer Topical Meeting on Advancing Precision in Additive Manufacturing - Berkeley, Verenigde Staten van Amerika Duur: 22 jul. 2018 → 25 jul. 2018

Congres

Congres	2018 ASPE and EUSPEN Summer Topical Meeting on Advancing Precision in Additive Manufacturing
Land/Regio	Verenigde Staten van Amerika
Stad	Berkeley
Periode	22/07/18 → 25/07/18

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@inproceedings{e05926920b2c4fe9bcf7c6755e097ae9,

title = "A classification scheme for AM control strategies: the AM V-model",

abstract = "The current lack of consistent additive manufacturing (AM) part quality gives rise to the development of novel process monitoring and control strategies [1]. The identification of these strategies can be facilitated by formulating a classification scheme to position development efforts. This work proposes a classification scheme that was developed in the context of vat photopolymerization [2], but is expected to be applicable to a wide range of AM technologies since many commonalities exist in the multi-level control characteristics.",

author = "Thomas Hafkamp and {van Baars}, Gregor and {de Jager}, Bram and Pascal Etman",

year = "2018",

month = jan,

day = "1",

language = "English",

pages = "161--166",

booktitle = "Proceedings - 2018 ASPE and euspen Summer Topical Meeting",

publisher = "American Society of Precision Engineering (ASPE)",

note = "2018 ASPE and EUSPEN Summer Topical Meeting on Advancing Precision in Additive Manufacturing ; Conference date: 22-07-2018 Through 25-07-2018",

}

Hafkamp, T, van Baars, G, de Jager, B & Etman, P 2018, A classification scheme for AM control strategies: the AM V-model. in Proceedings - 2018 ASPE and euspen Summer Topical Meeting: Advancing Precision in Additive Manufacturing. American Society of Precision Engineering (ASPE), Raleigh, blz. 161-166, 2018 ASPE and EUSPEN Summer Topical Meeting on Advancing Precision in Additive Manufacturing, Berkeley, Verenigde Staten van Amerika, 22/07/18.

A classification scheme for AM control strategies: the AM V-model. / Hafkamp, Thomas; van Baars, Gregor; de Jager, Bram et al.
Proceedings - 2018 ASPE and euspen Summer Topical Meeting: Advancing Precision in Additive Manufacturing. Raleigh: American Society of Precision Engineering (ASPE), 2018. blz. 161-166.

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

TY - GEN

T1 - A classification scheme for AM control strategies

T2 - 2018 ASPE and EUSPEN Summer Topical Meeting on Advancing Precision in Additive Manufacturing

AU - Hafkamp, Thomas

AU - van Baars, Gregor

AU - de Jager, Bram

AU - Etman, Pascal

PY - 2018/1/1

Y1 - 2018/1/1

N2 - The current lack of consistent additive manufacturing (AM) part quality gives rise to the development of novel process monitoring and control strategies [1]. The identification of these strategies can be facilitated by formulating a classification scheme to position development efforts. This work proposes a classification scheme that was developed in the context of vat photopolymerization [2], but is expected to be applicable to a wide range of AM technologies since many commonalities exist in the multi-level control characteristics.

AB - The current lack of consistent additive manufacturing (AM) part quality gives rise to the development of novel process monitoring and control strategies [1]. The identification of these strategies can be facilitated by formulating a classification scheme to position development efforts. This work proposes a classification scheme that was developed in the context of vat photopolymerization [2], but is expected to be applicable to a wide range of AM technologies since many commonalities exist in the multi-level control characteristics.

UR - http://www.scopus.com/inward/record.url?scp=85060403438&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85060403438

SP - 161

EP - 166

BT - Proceedings - 2018 ASPE and euspen Summer Topical Meeting

PB - American Society of Precision Engineering (ASPE)

CY - Raleigh

Y2 - 22 July 2018 through 25 July 2018

ER -

A classification scheme for AM control strategies: the AM V-model

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