2D electron cyclotron emission imaging at ASDEX Upgrade

I.G.J. Classen, J.E. Boom, W. Suttrop, E. Schmid, B.J. Tobias, C.W. Domier, N.C. Luhmann, A.J.H. Donné, R.J.E. Jaspers, P.C. de Vries, H.K. Park, T. Munsat, M. García-Munoz, P.A. Schneider

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Samenvatting

The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfv´n eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented. © 2010 American Institute of Physics.
Originele taal-2Engels
Artikelnummer10D929
Pagina's (van-tot)10D929
Aantal pagina's6
TijdschriftReview of Scientific Instruments
Volume81
Nummer van het tijdschrift10
DOI's
StatusGepubliceerd - 2010

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