1/f noise in homogeneous and inhomogeneous media

L.K.J. Vandamme, G. Trefan

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40 Citaten (Scopus)
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Some experimental techniques for low-frequency resistance noise measurements are discussed. The criterion for using a low-noise current amplifier instead of voltage amplifier is given. A distinction is made between contact and bulk resistance contributions to the observed I If noise. The merits and difficulties of the application of the empirical relation for the 1/f noise in homogeneous and inhomogeneous media are addressed. The criterion that 1/f noise in homogeneous samples can only be detected for a number of free carriers N <1014 is calculated. The authors explain why the enhanced 1/f noise, due to poor crystal quality, current crowding at contacts or at grain boundaries, and at inhomogeneous internal interfaces can be used as a diagnostic tool for quality and reliability assessment of electronic devices
Originele taal-2Engels
Pagina's (van-tot)3-12
Aantal pagina's10
TijdschriftIEE Proceedings - Circuits, Devices and Systems
Nummer van het tijdschrift1
StatusGepubliceerd - 2002


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