Als u wijzigingen in Pure hebt gemaakt, zullen deze hier binnenkort zichtbaar zijn.

Persoonlijk profiel

Research profile

My academic interest can be summarized as follows: studying the growth of ultra-thin films by atomic-layer deposition and their characterization using advanced (nonlinear) optical diagnostics with an emphasis on their defects and non-idealities.

Academic background

My most recent work was a postdoc focussing on the growth and characterization of 2D transition metal dichalcogenides (TMDs). In this project, I co-developed new ALD processes for the growth of these TMDs. Furthermore, I developed a new framework for texture characterization using Raman spectroscopy based upon new fundamental insight I obtained into the Raman response of nanocrystalline TMDs.

My PhD research encompassed mechanistic studies of the prototypical ALD processes for metal-oxide (thermal ALD of Al2O3) and for noble metal ALD (thermal ALD of Pt) using a new diagnostics: broadband sum-frequency generation (BB-SFG) spectroscopy. The surface chemistry during these processes was studied for the first time with this state-of-the-art technique which relies on the mixing of mid-IR and visible fs laser pulses. As such, SFG in a second-order nonlinear optical process making BB-SFG spectroscopy inherently surface sensitive. This property, combined with the all optical nature of BB-SFG, makes it ideally suited for in-situ studies of the surface chemistry. A purpose built setup was realized in the project and these BB-SFG studies revealed several key non-idealities in the growth mechanism of these well-studied prototypical ALD processes.

I also studyied the surface chemistry of plasma-enhanced ALD of Al2O3 using ATR-FTIR spectroscopy at the Colorado School of Mines (CSM) and I worked on the characterization of the SiO2/Si and Al2O3/Si interface relevant for nano-electronic and photovoltaic devices with phase-sensitive second-harmonic generation (SHG) spectroscopy. In conjunctino to probing the electronic structure of the interface, SHG can also reveal and quantify the presence of built-in charges near these interfaces which is a key property for device fabrication.

Apart from my passion for physics, I am also interested in computer science which resulted in e.g.  a project at the department of Mathematics and Computer Science performing real-time visualization of the execution of computer code.

Vingerafdruk Verdiep u in de onderzoeksgebieden waarop Vincent Vandalon actief is. Deze onderwerplabels komen uit het werk van deze persoon. Samen vormen ze een unieke vingerafdruk.

  • 15 Soortgelijke profielen

Netwerk Recente externe samenwerking op landenniveau. Duik in de details door op de stippen te klikken.

Onderzoeksoutput

  • 223 Citaties
  • 19 Tijdschriftartikel
  • 1 Conferentiebijdrage
  • 1 Dissertatie 1 (Onderzoek TU/e / Promotie TU/e)
Open Access
  • Probing the origin and suppression of vertically oriented nanostructures of 2D WS2 layers

    Balasubramanyam, S., Bloodgood, M., van Ommeren, M., Faraz, T., Vandalon, V., Kessels, W. M. M. E., Verheijen, M. A. & Bol, A. A., 22 jan 2020, In : ACS Applied Materials & Interfaces. 12, 3, blz. 3873-3885 13 blz.

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

    Open Access
    Bestand
  • 7 Downloads (Pure)

    Chemical analysis of the interface between hybrid organic−inorganic perovskite and atomic layer deposited Al2O3

    Koushik, D., Hazendonk, L., Zardetto, V., Vandalon, V., Verheijen, M. A., Kessels, W. M. M. & Creatore, M., 6 feb 2019, In : ACS Applied Materials & Interfaces. 11, 5, blz. 5526-5535 10 blz.

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

    Open Access
    Bestand
  • 4 Citaten (Scopus)
    127 Downloads (Pure)
    Open Access
    Bestand
  • 4 Citaten (Scopus)
    93 Downloads (Pure)

    Infrared and optical emission spectroscopy study of atmospheric pressure plasma-enhanced spatial ALD of Al2O3

    Mione, M., Engeln, R., Vandalon, V., Kessels, E. & Roozeboom, F., 19 aug 2019, In : Applied Physics Letters. 115, 8, 5 blz., 083101.

    Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

  • Prijzen

    Student Award best oral presentation

    Vincent Vandalon (Ontvanger), 30 jun 2015

    Prijs: AndersWerk, activiteit of publicatie gerelateerde prijzen (lifetime, best paper, poster etc.)Wetenschappelijk

    Scriptie

    Characterization of self-assembled monolayers with FTIR and SE

    Auteur: Riberi, F., 2013

    Begeleider: Vandalon, V. (Afstudeerdocent 1) & Kessels, W. (Afstudeerdocent 2)

    Scriptie/masterproef: Bachelor

    Bestand

    Measuring film resistivity: understanding and refining the four-point probe set-up

    Auteur: Kikken, S. P., 2018

    Begeleider: Vandalon, V. (Afstudeerdocent 1) & Bol, A. A. (Afstudeerdocent 2)

    Scriptie/masterproef: Bachelor

    Bestand

    Second-Harmonic Generation: spectroscopic phase and intensity study of the Si(100) interface with SiO2 and Al2O3 thin films

    Auteur: Vandalon, V., 31 aug 2011

    Begeleider: Terlinden, N. (Afstudeerdocent 1) & Kessels, W. (Afstudeerdocent 2)

    Scriptie/masterproef: Master

    Bestand

    Study of the Si(100) Al2O3 interface by second-harmonic general and electrically detected magnetic resonance

    Auteur: Bosch, R., 31 mrt 2012

    Begeleider: Vandalon, V. (Afstudeerdocent 1), Terlinden, N. (Afstudeerdocent 2) & Kessels, W. (Afstudeerdocent 2)

    Scriptie/masterproef: Master

    Bestand