Projecten per jaar
Zoekresultaten
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Afgelopen
Maxwell: Maxwell modeling for chip metrology target electromagnetic-scattering analysis with cross talk (MAX META-XT)
van Beurden, M. C. (Project Manager), Sun, L. (Projectmedewerker), Sepehripour, F. (Projectmedewerker) & Sanders, R. (Project communicatie medewerker)
1/10/18 → 1/08/23
Project: Onderzoek direct
Bestand -
Sub-wavelength resolution Lensless Imaging Algorithms and Tests
Sanders, R. (Project communicatie medewerker), van Beurden, M. C. (Project Manager), Bojanic, R. (Projectmedewerker), Eijsvogel, S. (Projectmedewerker) & Smolders, A. B. (Projectmedewerker)
1/09/18 → 31/08/24
Project: Second tier
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Integral Equation Method 2D CD Reconstruction
van Beurden, M. C. (Project Manager), van Beurden, M. C. (Projectmedewerker), Barzegar, E. (Projectmedewerker) & Huang, L. (Projectmedewerker)
1/04/08 → 1/12/18
Project: Onderzoek direct