Persoonlijk profiel
Research profile
Correlative Light Electron Microscopy (CLEM) is an advanced imaging approach that integrates the strengths of fluorescent microscopy (FM) and electron microscopy (EM). FM allows the labeling of the molecules of interest with fluorescent dyes to study their interaction with the surroundings and function in their native state while EM can give high-resolution structural information and morphology of the sample. The goal of my project is to develop CLEM method to characterize polymeric materials and understand structure-activity relationship at single particle level.