Projecten per jaar
Persoonlijk profiel
Quote
“A sustainable society requires durable materials and material systems, in which the damage and failure mechanisms that act at the microscale are understood and controlled.”
Research profile
Johan Hoefnagels is an Associate Professor in the Eindhoven University of Technology (TU/e) group Mechanics of Materials at Mechanical Engineering, following his earlier background in applied plasma physics and advanced optical diagnostics. His current research focuses on experimental micromechanics of ‘thin films and interfaces’, by studying the systems’ micro-mechanics through integration of mechanical-microscopic characterization of underlying micro-mechanisms, such as damage and fracture, and integrate coupling of numerical simulations to experimental procedures. Topics of particular interest include delamination, ductile damage, size effects, flexible and stretchable electronics and MEMS. One of Johan’s research projects involves investigating a revolutionary mechanism to make electronics extremely stretchable and demonstrating this by means of an inflatable, in-vivo ultrasound detector, for which the first key step has been achieved: a free-standing interconnect has been designed that can be elastically stretched beyond 2000% and cyclically stretched at 1000% for over 10 million times.
- Visit the Hoefnagels group page
Academic background
Johan Hoefnagels obtained his MSc and PhD in Applied Physics at TU/e, with a PhD thesis on advanced optical diagnostics of surface processes during thin film deposition. After his PhD he made a dramatic switch to become assistant professor in ‘experimental micromechanics’ at the department of mechanical engineering, where he later became associate professor in the same field. He leads the ‘Multi-Scale lab’ dedicated to ‘integrated mechanical testing’, which is one of TU/e’s 10 strategic labs.
Till 2018, Johan has (co-)authored >80 journal publications (of which ~50 times as corresponding author) and >100 refereed proceedings/book contributions. At international conferences, has given >100 presentations, of which around a third on invitation, and organized over 10 symposia. He has over two years of international research experience, built up during international visits to, amongst others, IMEC (Leuven, Belgium), SUNY (Albany, USA), NIST (Gaithersburg, USA), CSM (Golden, USA), and Harvard University (Cambridge, USA). He is Editor-in-Chief of scientific Journal Strain (impact factor 2.2) and Dutch representative of the European Structural Integrity Society (ESIS).
- view here Johan's resume
Affiliated with
Partners in (semi-)industry
- Philips Research / Lighting / DAP / Lumileds
- Tata
- VDL
- Océ
- Holst Centrum
- TNO
- NXP
- ASML
- Ramlab
- Cirrus Logic
- Lumileds
- Sabic
- IMEC
- M2i
- and others
Opleiding / Academische kwalificatie
NWO
Datum van toekenning: 1 mei 2013
Elsevier
Datum van toekenning: 1 mrt 2011
NWO
Datum van toekenning: 1 mei 2008
NWO
Datum van toekenning: 1 mrt 2006
American Vacuum Society
Datum van toekenning: 1 mei 2003
American Vacuum Society
Datum van toekenning: 1 mei 2001
SUNY Stony Brook
Datum van toekenning: 1 mei 1997
Technische Universiteit Eindhoven
Datum van toekenning: 1 mei 1997
Vingerafdruk
- 5 Soortgelijke profielen
Netwerk
Projecten
- 1 Actief
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Unraveling the effect of microstructure statistics on failure of multiphase steels NWO-TTW/HTM 16348
Hoefnagels, J. P. M., van Maris, M. P. F. H. L., Vermeij, T. & Wijnen, J.
1/01/18 → 31/08/22
Project: Onderzoek direct
Onderzoeksoutput
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Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction
Vermeij, T., De Graef, M. & Hoefnagels, J., 15 mrt 2019, In : Scripta Materialia. 162, blz. 266-271 6 blz.Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review
10 Citaten (Scopus)6 Downloads (Pure) -
Ferrite slip system activation investigated by uniaxial micro-tensile tests and simulations
Du, C., Maresca, F., Geers, M. G. D. & Hoefnagels, J. P. M., 1 mrt 2018, In : Acta Materialia. 146, blz. 314-327 14 blz.Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review
20 Citaten (Scopus)3 Downloads (Pure) -
Retardation of plastic instability via damage-enabled micro-strain delocalization
Hoefnagels, J. P. M., Tasan, C. C., Maresca, F., Peters, F. J. & Kouznetsova, V., 2015, In : Journal of Materials Science. 50, 21, blz. 6682-6897 16 blz.Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review
Open AccessBestand19 Citaten (Scopus)272 Downloads (Pure) -
Copper–rubber interface delamination in stretchable electronics
Hoefnagels, J. P. M., Neggers, J., Timmermans, P. H. M., Sluis, van der, O. & Geers, M. G. D., 2010, In : Scripta Materialia. 63, 8, blz. 875-878Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review
30 Citaten (Scopus) -
Processing induced size effects in plastic yielding upon miniaturisation
Janssen, P. J. M., Hoefnagels, J. P. M., de Keijser, T. H. & Geers, M. G. D., 2008, In : Journal of the Mechanics and Physics of Solids. 56, 8, blz. 2687-2706Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review
28 Citaten (Scopus)3 Downloads (Pure)
Prijzen
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NWO Vidi Award on "Stretching the limits of stretchable electronics"
Hoefnagels, Johan P.M. (Ontvanger), 2012
Prijs: NWO › Vidi › Wetenschappelijk
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VENI personal grant on "Novel Routes Towards Interfacial Integrity in Stretchable Electronics’"
Hoefnagels, Johan P.M. (Ontvanger), 2008
Prijs: NWO › Veni › Wetenschappelijk
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RUBICON personal grant
Hoefnagels, Johan P.M. (Ontvanger), 2005
Prijs: NWO › Rubicon › Wetenschappelijk
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Opening plenary lecture at the BSSM annual conference.
Hoefnagels, Johan P.M. (Ontvanger), 2016
Prijs: Anders › Overig › Wetenschappelijk
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Top Reviewer 2011 Engineering Fracture Mechanics
Hoefnagels, Johan P.M. (Ontvanger), 2011
Prijs: Anders › Werk, activiteit of publicatie gerelateerde prijzen (lifetime, best paper, poster etc.) › Wetenschappelijk
Cursussen
Knipsels
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Acta Journals’ Outstanding Reviewers in 2019
Johan P.M. Hoefnagels & Yi Wang
11/05/20
1 item van Media-aandacht
Pers / media: Vakinhoudelijk commentaar
Impacts
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Theme 1: Damage and failure in advanced engineering materials
Johan P.M. Hoefnagels (Onderzoeker) & Mirna van den Boomen (Administratieve ondersteuning)
Impact: Research Topic/Theme (at group level)
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Theme 2: Miniaturisation and MEMS: Mechanical size effects, membranes and thin films
Johan P.M. Hoefnagels (Onderzoeker) & Mirna van den Boomen (Administratieve ondersteuning)
Impact: Research Topic/Theme (at group level)
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Theme 3: Mechanics of interfaces: Delamination and debonding
Johan P.M. Hoefnagels (Onderzoeker) & Mirna van den Boomen (Administratieve ondersteuning)
Impact: Research Topic/Theme (at group level)
Bestand -
Theme 4: Flexible and stretchable electronics
Johan P.M. Hoefnagels (Onderzoeker) & Mirna van den Boomen (Administratieve ondersteuning)
Impact: Research Topic/Theme (at group level)
Scriptie
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Cavity ringdown study of the densities and kinetics of SiHx radicals in a remote SiH4 plasma
Auteur: Hoefnagels, J., 31 aug 2000Begeleider: Kessels, W. (Afstudeerdocent 1), Boogaarts, M. G. (Externe persoon) (Afstudeerdocent 2), van de Sanden, M. (Afstudeerdocent 2) & Schram, D. (Afstudeerdocent 2)
Scriptie/Masterproef: Master
Bestand