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Persoonlijk profiel


“A sustainable society requires durable materials and material systems, in which the damage and failure mechanisms that act at the microscale are understood and controlled.”

Research profile

Johan Hoefnagels is an Associate Professor in the Eindhoven University of Technology (TU/e) group Mechanics of Materials at Mechanical Engineering, following his earlier background in applied plasma physics and advanced optical diagnostics. His current research focuses on experimental micromechanics of ‘thin films and interfaces’, by studying the systems’ micro-mechanics through integration of mechanical-microscopic characterization of underlying micro-mechanisms, such as damage and fracture, and integrate coupling of numerical simulations to experimental procedures. Topics of particular interest include delamination, ductile damage, size effects, flexible and stretchable electronics and MEMS. One of Johan’s research projects involves investigating a revolutionary mechanism to make electronics extremely stretchable and demonstrating this by means of an inflatable, in-vivo ultrasound detector, for which the first key step has been achieved: a free-standing interconnect has been designed that can be elastically stretched beyond 2000% and cyclically stretched at 1000% for over 10 million times. 

- Visit the Hoefnagels group page:

Academic background

Johan Hoefnagels obtained his MSc and PhD in Applied Physics at TU/e, with a PhD thesis on advanced optical diagnostics of surface processes during thin film deposition. After his PhD he made a dramatic switch to become assistant professor in ‘experimental micromechanics’ at the department of mechanical engineering, where he later became associate professor in the same field. He leads the ‘Multi-Scale lab’ dedicated to ‘integrated mechanical testing’, which is one of TU/e’s 10 strategic labs.

Till 2018, Johan has (co-)authored ~75 journal publications (of which ~45 times as corresponding author) and >100 refereed proceedings/book contributions. At international conferences, has given >100 presentations, of which around a third on invitation, and organized 10 symposia. He has built up >2 years of international research experience during international visits to, amongst others, IMEC (Leuven, Belgium), SUNY (Albany, USA), NIST (Gaithersburg, USA), CSM (Golden, USA), and Harvard University (Cambridge, USA). And he holds, among others, the positions of Associate Editor of scientific Journal ‘Strain’ (impact factor 1.7) and Dutch representative of the European Structural Integrity Society.

- view Johan's resume:

Affiliated with

Partners in (semi-)industry

  • Philips Research / Lighting / DAP / Lumileds
  • Tata
  • VDL
  • Océ
  • Holst Centrum
  • TNO
  • NXP
  • ASML
  • Ramlab
  • Cirrus Logic
  • Lumileds
  • Sabic
  • IMEC
  • M2i
  • and others

Opleiding / Academische kwalificatie





American Vacuum Society

American Vacuum Society

SUNY Stony Brook

Technische Universiteit Eindhoven

Vingerafdruk Duik in de onderzoeksthema's waar Johan P.M. Hoefnagels actief is. Deze onderwerplabels komen voort uit het werk van deze persoon. Samen vormen ze een unieke vingerafdruk.

  • 5 Vergelijkbare profielen
Delamination Engineering en materiaalwetenschappen
Plasticity Engineering en materiaalwetenschappen
Martensite Engineering en materiaalwetenschappen
Electronic equipment Engineering en materiaalwetenschappen
Steel Chemische stoffen
Experiments Engineering en materiaalwetenschappen
Kinematics Engineering en materiaalwetenschappen
rubber Fysica en Astronomie

Netwerk Recente externe samenwerking op landenniveau. Duik in de details door op de stippen te klikken.

Onderzoeksoutput 1999 2020

6 Citaties (Scopus)
5 Downloads (Pure)

Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

Vermeij, T., De Graef, M. & Hoefnagels, J., 15 mrt 2019, In : Scripta Materialia. 162, blz. 266-271 6 blz.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Electron diffraction
diffraction patterns
electron counters
Crystal orientation
Diffraction patterns
10 Citaties (Scopus)
2 Downloads (Pure)

Ferrite slip system activation investigated by uniaxial micro-tensile tests and simulations

Du, C., Maresca, F., Geers, M. G. D. & Hoefnagels, J. P. M., 1 mrt 2018, In : Acta Materialia. 146, blz. 314-327 14 blz.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Chemical activation
12 Citaties (Scopus)
158 Downloads (Pure)

Retardation of plastic instability via damage-enabled micro-strain delocalization

Hoefnagels, J. P. M., Tasan, C. C., Maresca, F., Peters, F. J. & Kouznetsova, V., 2015, In : Journal of Materials Science. 50, 21, blz. 6682-6897 16 blz.

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Open Access
28 Citaties (Scopus)

Copper–rubber interface delamination in stretchable electronics

Hoefnagels, J. P. M., Neggers, J., Timmermans, P. H. M., Sluis, van der, O. & Geers, M. G. D., 2010, In : Scripta Materialia. 63, 8, blz. 875-878

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

Electronic equipment
24 Citaties (Scopus)
3 Downloads (Pure)

Processing induced size effects in plastic yielding upon miniaturisation

Janssen, P. J. M., Hoefnagels, J. P. M., de Keijser, T. H. & Geers, M. G. D., 2008, In : Journal of the Mechanics and Physics of Solids. 56, 8, blz. 2687-2706

Onderzoeksoutput: Bijdrage aan tijdschriftTijdschriftartikelAcademicpeer review

plastic deformation
laser cutting


NWO Vidi Award on "Stretching the limits of stretchable electronics"

J.P.M. Hoefnagels (Ontvanger), 2012

Prijs: NWOVidiWetenschappelijk

Electronic equipment

RUBICON personal grant

Johan P.M. Hoefnagels (Ontvanger), 2005

Prijs: NWORubiconWetenschappelijk

Opening plenary lecture at the BSSM annual conference.

Johan P.M. Hoefnagels (Ontvanger), 2016

Prijs: AndersOverigWetenschappelijk

strain measurement
plastic properties

Top Reviewer 2011 Engineering Fracture Mechanics

Johan P.M. Hoefnagels (Ontvanger), 2011

Prijs: AndersWerk, activiteit of publicatie gerelateerde prijzen (lifetime, best paper, poster etc.)Wetenschappelijk



Theme 1: Damage and failure in advanced engineering materials

Johan P.M. Hoefnagels (Onderzoeker), Mirna van den Boomen (Administratieve ondersteuning)

Impact: Research Topic/Theme (at group level)

Theme 2: Miniaturisation and mems: Mechanical size effects, membranes and thin films

Johan P.M. Hoefnagels (Onderzoeker), Mirna van den Boomen (Administratieve ondersteuning)

Impact: Research Topic/Theme (at group level)

Theme 3: Mechanics of interfaces: Delamination and debonding

Johan P.M. Hoefnagels (Onderzoeker), Mirna van den Boomen (Administratieve ondersteuning)

Impact: Research Topic/Theme (at group level)


Theme 4: Flexible and stretchable electronics

Johan P.M. Hoefnagels (Onderzoeker), Mirna van den Boomen (Administratieve ondersteuning)

Impact: Research Topic/Theme (at group level)


An analytical-experimental approach for interface characterization using integrated DIC

Auteur: Baan, M., 31 jan 2015

Begeleider: Hoefnagels, J. (Afstudeerdocent 1) & van der Sluis, O. (Afstudeerdocent 2)

Scriptie/masterproef: Master

A novel pure bending test methodology for the investigation of mechanical failure behavior of flexible electronics

Auteur: Ruybalid, A., 31 mrt 2013

Begeleider: Hoefnagels, J. (Afstudeerdocent 1), Geers, M. (Afstudeerdocent 2), Bouten, P. C. (Externe persoon) (Externe coach) & van Breemen, L. (Afstudeerdocent 2)

Scriptie/masterproef: Master

Cavity ringdown study of the densities and kinetics of SiHx radicals in a remote SiH4 plasma

Auteur: Hoefnagels, J., 31 aug 2000

Begeleider: Kessels, W. (Afstudeerdocent 1), Boogaarts, M. G. (Externe persoon) (Afstudeerdocent 2), van de Sanden, M. (Afstudeerdocent 2) & Schram, D. (Afstudeerdocent 2)

Scriptie/masterproef: Master


Characterization and modeling of interfacial adhesion for semiconductor applications covering the full range of mode mixity

Auteur: Thijsse, J., 30 jun 2006

Begeleider: Geers, M. (Afstudeerdocent 1), van Dommelen, J. (Afstudeerdocent 2), Luijten, C. (Afstudeerdocent 2), Hoefnagels, J. (Afstudeerdocent 2), van der Sluis, O. (Externe coach) & van Driel, W. (Externe coach)

Scriptie/masterproef: Master