Onderzoeksoutput per jaar
Onderzoeksoutput per jaar
Onderzoeksoutput
- 5 Conferentiebijdrage
- 5 resultaten
Zoekresultaten
-
2023
Signal Reconstruction for FMCW Radar Interference Mitigation Using Deep Unfolding
Overdevest, J., Koppelaar, A. G. C., Bekooij, M. J. G., Youn, J. & Sloun, R. J. G. V., 5 mei 2023, ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP). Institute of Electrical and Electronics Engineers, 5 blz. 10096297Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review
2 Citaten (Scopus) -
2022
A Hybrid Deep Learning Pipeline for Improved Ultrasound Localization Microscopy
Stevens, T. S. W., Herbst, E. B., Luijten, B., Ossenkoppele, B., Voskuil, T. J., Wang, S., Youn, J., Errico, C., Mischi, M., Pezzotti, N. & van Sloun, R. J. G., 1 dec. 2022, 2022 IEEE International Ultrasonics Symposium (IUS). Institute of Electrical and Electronics Engineers, 4 blz. 9958562Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic
1 Citaat (Scopus)1 Downloads (Pure) -
Circular Convolutional Learned ISTA for Automotive Radar DOA Estimation
Youn, J., Ravindran, S., Wu, R., Li, J. & van Sloun, R., 25 okt. 2022, 2022 19th European Radar Conference (EuRAD). Institute of Electrical and Electronics Engineers, blz. 273-276 4 blz. 9924887Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review
3 Citaten (Scopus)2 Downloads (Pure) -
2021
Model-based Deep Learning on Ultrasound Channel Data for Fast Ultrasound Localization Microscopy
Youn, J., Luijten, B., Schou, M., Stuart, M. B., Eldar, Y. C., van Sloun, R. J. G. & Jensen, J. A., 15 nov. 2021, 2021 IEEE International Ultrasonics Symposium (IUS). Institute of Electrical and Electronics Engineers, 4 blz. 9593435Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic
Open Access4 Citaten (Scopus)1 Downloads (Pure) -
2020
Deep Learning Models for Fast Ultrasound Localization Microscopy
Youn, J., Luijten, B., Stuart, M. B., Eldar, Y. C., van Sloun, R. J. G. & Jensen, J. A., 17 nov. 2020, 2020 IEEE International Ultrasonics Symposium (IUS). Institute of Electrical and Electronics Engineers, 4 blz. 9251561Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic
Open Access8 Citaten (Scopus)