Aida Todri-Sanial

Onderzoeksoutput

Onderzoeksoutput per jaar 2007 2013 2014 2016 2018 2021 2022 2023 2024 2024

• 101 Conferentiebijdrage
• 67 Tijdschriftartikel
• 6 Hoofdstuk
• 4 Editorial
• 20 Meer
  • 3 Paper
  • 3 Artikel recenseren
  • 3 Octrooi-publicatie
  • 2 Boekredactie
  • 2 Poster
  • 2 Overige bijdrage
  • 2 Preprint
  • 1 Voorwoord/editorial
  • 1 Dissertatie 4 (Onderzoek NIET TU/e / Promotie NIET TU/e)
  • 1 Werkdocument

Onderzoeksoutput per jaar

Onderzoeksoutput per jaar

Zoekresultaten

• 2017

  Electrical performance of carbon-based power distribution networks with thermal effects

  Magnani, A., de Magistris, M., Heidari, S., Todri-Sanial, A. & Maffucci, A., 7 jun. 2017, 2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings. Institute of Electrical and Electronics Engineers, 4 blz. 7944044

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Electric Power Distribution 100%
  • Performance Analysis 100%
  • Power Distribution 100%
  • Thermal Effect 100%
  • Electrical Performance 100%

• Electromigration alleviation techniques for 3D integrated circuits

  Cheng, Y., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P., Virazel, A., Vivet, P. & Belleville, M., 1 jan. 2017, High Performance Computing for Big Data: Methodologies and Applications. Wang, C. (uitgave). CRC Press, blz. 37-58 22 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

  • Integrated Circuit 100%
  • Electromigration 100%
  • Integrated Circuits 100%
  • through silicon vias 100%
  • Silicon 100%

• Exploring Carbon Nanotubes for 3D Power Delivery Networks

  Todri-Sanial, A., 2017, Carbon Nanotubes for Interconnects: Process, Design and Applications. Todri-Sanial, A., Dijon, J. & Maffucci, A. (uitgave). Cham: Springer, blz. 288-314 32 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

  • Carbon Nanotubes 100%
  • Interconnects 50%
  • Power Density 25%
  • Expansion Coefficient 25%
  • Elevated Temperature 25%

• Synchronised 4-phase resonant power clock supply for energy efficient adiabatic logic

  Jeanniot, N., Pillonnet, G., Nouet, P., Azemard, N. & Todri-Sanial, A., 28 nov. 2017, 2017 IEEE International Conference on Rebooting Computing, ICRC 2017 - Proceedings. Institute of Electrical and Electronics Engineers, blz. 1-6 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Energy Engineering 100%
  • Power Supply 100%
  • Control Signal 100%
  • Electric Power Utilization 50%
  • Energy Conservation 50%
  11 Citaten (Scopus)

• The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulations

  Lee, J., Berrada, S., Liang, J., Sadi, T., Georgiev, V. P., Todri-Sanial, A., Kalita, D., Ramos, R., Okuno, H., Dijon, J. & Asenov, A., 25 okt. 2017, 2017 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2017. Institute of Electrical and Electronics Engineers, blz. 157-160 4 blz. 8085288

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Electronic Circuit 100%
  • Vacancy Defect 100%
  • Carbon Nanotube 100%
  • Carbon Nanotubes 66%
  • Chirality 50%
  2 Citaten (Scopus)
• 2016

  A clustering technique for fast electrothermal analysis of on-chip power distribution networks

  Magnani, A., de Magistris, M., Maffucci, A. & Todri-Sanial, A., 20 jun. 2016, 2016 IEEE 20th Workshop on Signal and Power Integrity, SPI 2016 - Proceedings. Institute of Electrical and Electronics Engineers, 4 blz. 7496292

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Nodes 100%
  • Power Grid 100%
  • Electric Power Distribution 100%
  • Power Distribution 100%
  • Time Domain 50%

• Alleviating Through-Silicon-Via Electromigration for 3-D Integrated Circuits Taking Advantage of Self-Healing Effect

  Cheng, Y., Todri-Sanial, A., Yang, J. & Zhao, W., nov. 2016, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24, 11, blz. 3310-3322 13 blz., 7457317.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Integrated Circuit 100%
  • Electromigration 100%
  • Integrated Circuits 100%
  • through silicon vias 100%
  • Silicon 100%
  8 Citaten (Scopus)

• A Study of 3-D Power Delivery Networks With Multiple Clock Domains

  Todri-Sanial, A. & Cheng, Y., 2016, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24, 11, blz. 3218-3231 14 blz.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Power Supply Noise 100%
  • Power Delivery Network 100%
  • Power Supply 100%
  • Functional Unit 50%
  • Noise Distribution 50%
  6 Citaten (Scopus)

• Electrothermal Analysis of Carbon Nanotubes Power Delivery Networks for Nanoscale Integrated Circuits

  Magnani, A., de Magistris, M., Todri-Sanial, A. & Maffucci, A., 1 mei 2016, In: IEEE Transactions on Nanotechnology. 15, 3, blz. 380-388

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Integrated Circuit 100%
  • Carbon Nanotubes 100%
  • Nanoscale 100%
  • Electronic Circuit 100%
  • Nodes 25%
  14 Citaten (Scopus)

• Exploration of carbon nanotubes for efficient power delivery

  Todri-Sanial, A., 1 jan. 2016, Nano-CMOS and Post-CMOS Electronics: Devices and Modelling. Institution of Engineering and Technology (IET), blz. 265-285 21 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

  • Carbon Nanotubes 100%
  • Interconnects 50%
  • Two Dimensional 50%
  • Power Density 25%
  • Expansion Coefficient 25%
  1 Citaat (Scopus)

• Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era

  Todri-Sanial, A., Mohanty, S. P., Comte, M. & Belleville, M., 2016, In: ACM Journal on Emerging Technologies in Computing Systems. 13, 2, 2 blz., 12.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Editorial › Academic › peer review

• Investigation of electrical and thermal properties of carbon nanotube interconnects

  Todri-Sanial, A., 2016, 2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS). Institute of Electrical and Electronics Engineers, blz. 25-32 8 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Interconnects 100%
  • Carbon Nanotubes 100%
  • Thermal Property 100%
  • Electronic Circuit 16%
  • Young's Modulus 16%
  1 Citaat (Scopus)

• Investigation of the power-clock network impact on adiabatic logic

  Jeanniot, N., Todri-Sanial, A., Nouet, P., Pillonnet, G. & Fanet, H., 11 mei 2016, 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI). IEEE/LEOS, 4 blz. 7496270

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Energy Dissipation 100%
  • Power Supply 100%
  • Electric Power Utilization 50%
  • Energy Conservation 50%
  • Switching Frequency 50%
  10 Citaten (Scopus)

• Lumped electro-thermal modeling and analysis of carbon nanotube interconnects

  Todri-Sanial, A., 1 jan. 2016, Nano-CMOS and Post-CMOS Electronics: Circuits and Design. Institution of Engineering and Technology (IET), blz. 201-218 18 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Hoofdstuk › Academic › peer review

  • Interconnects 100%
  • Carbon Nanotubes 100%
  • Thermal Analysis 25%
  • Electronic Circuit 25%
  • Young's Modulus 25%
  1 Citaat (Scopus)

• Physical description and analysis of doped carbon nanotube interconnects

  Liang, J., Zhang, L., Azémard-Crestani, N., Nouet, P. & Todri-Sanial, A., 2016, 2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS). Institute of Electrical and Electronics Engineers, blz. 250-255 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Interconnects 100%
  • Physical Description 100%
  • Carbon Nanotubes 100%
  • Simulation Result 28%
  • Graphene 28%
  4 Citaten (Scopus)

• Physical Design for 3D Integrated Circuits

  Todri-Sanial, A. (Redacteur) & Tan, C. S. (Redacteur), 2016, 1st uitgave CRC Press. 415 blz.

  Onderzoeksoutput: Boek/rapport › Boekredactie › Academic › peer review

  • Three Dimensional Integrated Circuits 100%
  • Electronic Circuit 100%
  • Design Tool 20%
  • Cutting Edge 20%
  • Edge Information 20%

• Present and future prospects of carbon nanotube interconnects for energy efficient integrated circuits

  Todri-Sanial, A., Magnani, A., Magistris, M. D. & Maffucci, A., 20 apr. 2016, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). IEEE/LEOS, 5 blz. 7463379

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Energy Engineering 100%
  • Interconnects 100%
  • Integrated Circuit 100%
  • Carbon Nanotubes 100%
  • Electronic Circuit 100%
  5 Citaten (Scopus)

• Quantitative evaluation of reliability and performance for STT-MRAM

  Zhang, L., Todri-Sanial, A., Kang, W., Zhang, Y., Torres, L., Cheng, Y. & Zhao, W., 2016, 2016 IEEE International Symposium on Circuits and Systems (ISCAS). Institute of Electrical and Electronics Engineers, blz. 1150-1153 4 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Spin Transfer 100%
  • Random Access Memory 100%
  • Quantitative Evaluation 100%
  • Anisotropy 100%
  • Transistor 100%
  17 Citaten (Scopus)

• Reliability and performance evaluation for STT-MRAM under temperature variation

  Zhang, L., Cheng, Y., Kang, W., Zhang, Y., Torres, L., Zhao, W. & Todri-Sanial, A., 20 apr. 2016, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). IEEE/LEOS, 4 blz. 7463380

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Spin Transfer 100%
  • Random Access Memory 100%
  • Reliability Issue 42%
  • Simulation Experiment 28%
  • Energy Engineering 14%
  13 Citaten (Scopus)

• Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM

  Wu, B., Cheng, Y., Yang, J., Todri-Sanial, A. & Zhao, W., 6 okt. 2016, In: IEEE Transactions on Reliability. 65, 4, blz. 1755-1768 14 blz.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Spin Transfer 100%
  • Random Access Memory 100%
  • Impact Analysis 100%
  • Nodes 33%
  • Thermal Impact 33%
  47 Citaten (Scopus)
• 2015

  A body-biasing of readout circuit for STT-RAM with improved thermal reliability

  Yang, L., Cheng, Y., Wang, Y., Yu, H., Zhao, W. & Todri-Sanial, A., 2015, 2015 IEEE International Symposium on Circuits and Systems (ISCAS). Institute of Electrical and Electronics Engineers, blz. 1530-1533 4 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Reliability Availability and Maintainability (Reliability Engineering) 100%
  • Readout Circuit 100%
  • Nodes 33%
  • Electric Power Utilization 33%
  • Energy Conservation 33%
  11 Citaten (Scopus)

• An architecture-level cache simulation framework supporting advanced PMA STT-MRAM

  Wu, B., Cheng, Y., Wang, Y., Todri-Sanial, A., Sun, G., Torres, L. & Zhao, W., 2015, Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15). Institute of Electrical and Electronics Engineers, blz. 7-12 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Architecture Level 100%
  • Cache Simulation 100%
  • Design Framework 50%
  • Computer Architecture 50%
  • Memory Technology 50%
  7 Citaten (Scopus)

• A node clustering reduction scheme for power grids electrothermal analysis

  Magnani, A., de Magistris, M., Maffucci, A. & Todri-Sanial, A., 2 sep. 2015, SPI 2015 - 19th IEEE Workshop on Signal and Power Integrity. Institute of Electrical and Electronics Engineers, 4 blz. 7237399

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Nodes 100%
  • Power Grid 100%
  • Computational Cost 50%
  • Electric Power Distribution 25%
  • Temperature Drop 25%
  4 Citaten (Scopus)

• Carbon-based Power Delivery Networks for nanoscale ICs: Electrothermal performance analysis

  Magnani, A., de Magistris, M., Todri-Sanial, A. & Maffucci, A., 2015, IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers, blz. 416-419 4 blz. 7388625

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Graphene 100%
  • Carbon Nanotubes 100%
  • Electronic Circuit 50%
  • Electrical Resistance 50%
  1 Citaat (Scopus)

• Guest Editorial: Special issue on advances in design of ultra-low power circuits and systems in emerging technologies

  Todri-Sanial, A. & Bhanja, S., 1 aug. 2015, In: ACM Journal on Emerging Technologies in Computing Systems. 12, 2, 2 blz., 11.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Editorial › Academic › peer review
  1 Citaat (Scopus)

• Message from the general and program chairs

  Todri-Sanial, A., Girard, P., Di Natale, G., Mohanty, S. P. & Belleville, M., 27 okt. 2015, Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI. blz. xvii

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Voorwoord/editorial › Academic

  • Event 100%

• On analysis of on-chip DC-DC converters for power delivery networks

  Mouslih, G., Todri-Sanial, A. & Nouet, P., 29 okt. 2015, 2015 IEEE Computer Society Annual Symposium on VLSI. Institute of Electrical and Electronics Engineers, blz. 557-560 4 blz. 7309630

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • DC-to-DC Converter 100%
  • Time Domain 25%
  • Domain Analysis 25%
  • Frequency Analysis 25%
  • Voltage Regulator 25%
  3 Citaten (Scopus)

• On the Performance Exploration of 3D NoCs with Resistive-Open TSVs

  Effiong, C., Lapotre, V., Gamatié, A., Sassatelli, G., Todri-Sanial, A. & Latif, K., 2015, 2015 IEEE Computer Society Annual Symposium on VLSI. Institute of Electrical and Electronics Engineers, blz. 579-584 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Resistive 100%
  • Process Variation 100%
  • through silicon vias 100%
  • Energy Conservation 50%
  • Design Process 50%

• Statistical energy study for 28nm FDSOI devices

  Kheirallah, R., Galliere, J. M., Todri-Sanial, A., Azemard, N. & Ducharme, G., 6 mei 2015, 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015. Institute of Electrical and Electronics Engineers, 4 blz. 7103149

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Energy Engineering 100%
  • Process Variation 100%
  • Silicon on Insulator Devices 100%
  • Silicon 100%
  • Energy Conservation 50%
• 2014

  A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

  Azevedo, J., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Todri-Sanial, A., Alvarez-Herault, J. & Mackay, K., 2014, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22, 11, blz. 2326-2335 10 blz.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Defects 100%
  • Resistive 100%
  • Random Access Memory 100%
  • Magnetic Switching 100%
  • Density 100%
  21 Citaten (Scopus)

• A Comprehensive Evaluation of Functional Programs for Power-Aware Test

  Touati, A., Bosio, A., Dilillo, L., Girard, P., Todri-Sanial, A., Virazel, A. & Bernardi, P., 2014, 2014 IEEE 23rd North Atlantic Test Workshop. Institute of Electrical and Electronics Engineers, blz. 69-72 4 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Functional Program 100%
  2 Citaten (Scopus)

• A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise

  Asokan, A., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S. & Virazel, A., 22 sep. 2014, 2014 IEEE Computer Society Annual Symposium on VLSI. Institute of Electrical and Electronics Engineers, blz. 226-231 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Defects 100%
  • Metrics 100%
  • Process Variation 100%
  • Input Pattern 100%
  • Simulation Result 33%
  1 Citaat (Scopus)

• An intra-cell defect grading tool

  Bosio, A., Dilillo, L., Girard, P., Todri-Sanial, A., Virazel, A., Bernabovi, S. & Bernardi, P., 31 jul. 2014, 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, blz. 298-301 4 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Test Set 100%
  • Transistor 100%
  • Defects 100%
  5 Citaten (Scopus)

• An SRAM Based Monitor for Mixed-Field Radiation Environments

  Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Mekki, J., Brugger, M., Wrobel, F. & Saigne, F., 1 aug. 2014, In: IEEE Transactions on Nuclear Science. 61, 4, blz. 1663-1670

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Radiation Field 100%
  • Radiation Distribution 100%
  • Test Area 66%
  • Nodes 33%
  • Do Effect 33%
  17 Citaten (Scopus)

• Electro-thermal characterization of Through-Silicon Vias

  Todri-Sanial, A., 2014, 2014 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2014. IEEE Computer Society, 6813859

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Thermal Characterization 100%
  • Current Flow 100%
  • Interconnects 50%
  • Thermal Dissipation 50%
  • Ground Connection 50%
  3 Citaten (Scopus)

• Evaluating a radiation monitor for mixed-field environments based on SRAM technology

  Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Mekki, J., Brugger, M., Wrobel, F. & Saigne, F., 27 mei 2014, In: Journal of Instrumentation. 9, 5, 9 blz., C05052.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  Open Access

  • Fluence 100%
  • Radiation Effect 100%
  • Hadron 100%
  • Radiation Damage 100%
  • Single Event Upset 50%
  6 Citaten (Scopus)

• Exploring potentials of perpendicular magnetic anisotropy STT-MRAM for cache design

  Zhang, X., Cheng, Y., Zhao, W., Zhang, Y. & Todri-Sanial, A., 23 jan. 2014, Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014. Zhou, J. & Tang, T.-A. (uitgave). Institute of Electrical and Electronics Engineers, 7021342

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Power Consumption 100%
  • Design Cache 100%
  • Nodes 66%
  • Electric Power Utilization 66%
  • Emerging Technology 50%
  4 Citaten (Scopus)

• Globally Constrained Locally Optimized 3-D Power Delivery Networks

  Todri-Sanial, A., Kundu, S., Girard, P., Bosio, A., Dilillo, L. & Virazel, A., 2014, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22, 10, blz. 2131-2144 14 blz.

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Energy Demand 100%
  • Solution and Solubility 100%
  • Power Grid 50%
  • Transients 50%
  • Manufacturability 50%
  14 Citaten (Scopus)

• Habilitation - Design Space Exploration Of Emerging Technologies For Energy Efficiency

  Todri-Sanial, A., 17 dec. 2014

  Onderzoeksoutput: Scriptie › Dissertatie 4 (Onderzoek NIET TU/e / Promotie NIET TU/e)

  • Interconnects 100%
  • Energy Conservation 100%
  • Design Space 100%
  • Three Dimensional Integrated Circuits 100%
  • Energy Efficiency 100%

• iBoX - Jitter based Power Supply Noise sensor

  Valka, M., Bosio, A., Dilillo, L., Todri, A., Virazel, A., Girard, P., Debaud, P. & Guilhot, S., 2014, 2014 19th IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers, 2 blz. 6847830

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Power Supply 100%
  • Sensor Noise 100%
  1 Citaat (Scopus)

• Investigation of horizontally aligned carbon nanotubes for efficient power delivery in 3D ICs

  Todri-Sanial, A., 2014, 2014 18th IEEE Workshop on Signal and Power Integrity, SPI 2014 - Proceedings. IEEE Computer Society, 4 blz. 6844535

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Carbon Nanotubes 100%
  • Carbon Nanotube 100%
  • Interconnects 50%
  • Power Density 25%
  • Expansion Coefficient 25%
  5 Citaten (Scopus)

• Multiple Cell Upset Classification in Commercial SRAMs

  Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Puchner, H., Frost, C., Wrobel, F. & Saigne, F., 1 aug. 2014, In: IEEE Transactions on Nuclear Science. 61, 4, blz. 1747-1754

  Onderzoeksoutput: Bijdrage aan tijdschrift › Tijdschriftartikel › Academic › peer review

  • Multiple Cell 100%
  • Atmospherics 100%
  • Neutron Beam 100%
  • Error Correction Code 100%
  • Storage Element 100%
  52 Citaten (Scopus)

• Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce

  Asokan, A., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S. & Virazel, A., 2014, 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, blz. 207-212 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Crosstalk 100%
  • Power Supply 100%
  • Test Method 100%
  • Automatic Test Pattern Generation 100%
  • Defects 50%
  6 Citaten (Scopus)

• Performance exploration of partially connected 3D NoCs under manufacturing variability

  Kologeski, A., Kastensmidt, F. L., Lapotre, V., Gamatié, A., Sassatelli, G. & Todri-Sanial, A., 2014, 2014 IEEE 12th International New Circuits and Systems Conference (NEWCAS). Institute of Electrical and Electronics Engineers, blz. 61-64 4 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Resistive 100%
  • through silicon vias 100%
  • Silicon 100%
  • Network-on-Chip 66%
  • Defects 33%
  4 Citaten (Scopus)

• Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration

  Cheng, Y., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P. & Virazel, A., 2014, 2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC). Institute of Electrical and Electronics Engineers, blz. 544-549 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Power Supply 100%
  • Power Supply Noise 100%
  • Experimental Result 20%
  • Thermal Gradient 20%
  • Multiprocessor System 20%
  3 Citaten (Scopus)

• Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults

  Wali, I., Virazel, A., Bosio, A., Dilillo, L., Girard, P. & Todri, A., 2014, 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, blz. 223-225 3 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Combinational Logic 100%
  • Transient Fault 100%
  • Permanent Fault 100%
  • Power Efficient 33%
  • Fault Tolerant 33%
  3 Citaten (Scopus)

• Test and diagnosis of power switches

  Valka, M., Bosio, A., Dilillo, L., Todri, A., Virazel, A., Girard, P., Debaud, P. & Guilhot, S., 2014, 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, blz. 213-218 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Power Consumption 100%
  • Static Power 100%
  • Integrated Circuits 100%
  • Power Switch 100%
  • Electronic Circuit 100%
  1 Citaat (Scopus)

• Timing-aware ATPG for critical paths with multiple TSVs

  Metzler, C., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P. & Virazel, A., 2014, 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, blz. 116-121 6 blz.

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Defects 100%
  • Metrics 100%
  • Quality Level 100%
  • Detectability 100%
  • Technology Integration 100%
  1 Citaat (Scopus)

• TSV aware timing analysis and diagnosis in paths with multiple TSVs

  Metzler, C., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P. & Virazel, A., 2014, 2014 IEEE 32nd VLSI Test Symposium (VTS). Institute of Electrical and Electronics Engineers, 6 blz. 6818772

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Timing Analysis 100%
  • Fault Coverage 100%
  • Resistive 100%
  • Delay Variation 50%
  • Critical Path Delay 50%
  2 Citaten (Scopus)
• 2013

  A built-in scheme for testing and repairing voltage regulators of low-power srams

  Zordan, L. B., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A. & Badereddine, N., 27 jun. 2013, 2013 IEEE 31st VLSI Test Symposium (VTS). Institute of Electrical and Electronics Engineers, blz. 1-6 6 blz. 6548894

  Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › Academic › peer review

  • Power Consumption 100%
  • Static Power 100%
  • Reliable Operation 100%
  • build-in self-test 100%
  • Voltage Regulator 100%
  2 Citaten (Scopus)