Scanning Electron Microscope: Quanta3D FEG

Uitrusting/faciliteit: Uitrusting

    Uitrustingsdetails

    Tekst

    The Quanta3D is an instrument optimally suited for in-situ imaging and manipulation of a wide range of materials. It is equipped with a field emission electron source (FEG), secondary electron (SE), back scatter (BSE), an energy dispersive X-ray (EDX) detector and can be operated at acceleration voltages between 1 and 30 kV.
    The system is also equipped with a focussed ion beam (FIB) with a Gallium liquid metal ion source (Ga LMIS), a gas injection system (GIS) to deposit Platinum and a Omniprobe micromanipulator that enable 3D FIB-SEM tomography, sample micromachining and lift out sample preparation for (S)TEM.
    In addition, the Quanta3D is an in-situ SEM that features three vacuum modes (high, low and environmental SEM), a Peltier stage for heating and cooling, Kleindiek micromanipulators and a mechanical testing unit.
    The Quanta3D is used to study the morphology, composition, or mechanical properties of a wide range of samples, including composites, nanoparticles, coatings, porous materials, and catalysts.

    Details

    NaamScanning Electron Microscope: Quanta3D FEG
    Datum aankoop/verwerving1/01/11
    FabrikantenThermo Fisher Scientific

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