Uitrustingsdetails
Tekst
The Phenom ProX is an instrument optimally suited for imaging and elemental analysis of a wide range of materials. It is a table top scanning electron microscope equipped with an CeB6 electron source, a secondary electron (SE), a back scatter (BSE) and an energy dispersive X-Ray (EDX) detector and can be operated at acceleration voltages of 5, 10 and 15 kV.
A special sample holder for non-conductive samples is available.
The Phenom ProX is used to study the morphology and composition of a wide range of samples, including composites, coatings, porous materials, and catalysts.
A special sample holder for non-conductive samples is available.
The Phenom ProX is used to study the morphology and composition of a wide range of samples, including composites, coatings, porous materials, and catalysts.
Details
Naam | Scanning Electron Microscope: Phenom ProX |
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Datum aankoop/verwerving | 1/01/17 |
Fabrikanten | Thermo Fisher Scientific |

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