Scanning Electron Microscope: Phenom ProX

Uitrusting/faciliteit: Uitrusting

    Uitrustingsdetails

    Tekst

    The Phenom ProX is an instrument optimally suited for imaging and elemental analysis of a wide range of materials. It is a table top scanning electron microscope equipped with an CeB6 electron source, a secondary electron (SE), a back scatter (BSE) and an energy dispersive X-Ray (EDX) detector and can be operated at acceleration voltages of 5, 10 and 15 kV.
    A special sample holder for non-conductive samples is available.
    The Phenom ProX is used to study the morphology and composition of a wide range of samples, including composites, coatings, porous materials, and catalysts.

    Details

    NaamScanning Electron Microscope: Phenom ProX
    Datum aankoop/verwerving1/01/17
    FabrikantenThermo Fisher Scientific

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